• 한국전기전자재료학회논문지
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• 제30권2호
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• pp.115-118
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• 2017

Highly photosensitive and wide bandgap amorphous silicon oxide (a-$SiO_x$:H) films were developed at low temperature ranges ($100{\sim}150^{\circ}C$) with employing plasma-enhanced chemical vapor deposition by optimizing $H_2/SiH_4$ gas ratio and $CO_2$ flow. Photosensitivity more than $10^5$ and wide bandgap (1.81~1.85 eV) properties were used for making the a-$SiO_x$:H thin film solar cells, which exhibited a high open circuit voltage of 0.987 V at the substrate temperature of $100^{\circ}C$. In addition, a power conversion efficiency of 6.87% for the cell could be improved up to 7.77% by employing a new n-type nc-$SiO_x$:H/ZnO:Al/Ag triple back-reflector that offers better short circuit currents in the thin film photovoltaic devices.

• Corrosion Science and Technology
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• 제11권1호
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• pp.1-8
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• 2012

The development of martensitic grades which can be processed in continuous galvanizing lines requires the reduction of the oxides formed on the steel during the hot dip process. This reduction mechanism was investigated in detail by means of High Resolution Transmission Electron Microscopy (HR-TEM) of cross-sectional samples. Annealing of a martensitic steel in a 10% $H_2+N_2$ atmosphere with the dew point of $-35^{\circ}C$ resulted in the formation of a thin $_{C-X}MnO.SiO_{2}$ (x>1) oxide film and amorphous $_{a-X}MnO.SiO_{2}$ oxide particles on the surface. During the hot dip galvanizing in Zn-0.13%Al, the thin $_{C-X}MnO.SiO_{2}$ (x>1) oxide film was reduced by the Al. The $_{a-X}MnO.SiO_{2}$ (x<0.9) and $a-SiO_{2}$ oxides however remained embedded in the Zn coating close to the steel/coating interface. No $Fe_{2}Al_{5-X}Zn_{X}$ inhibition layer formation was observed. During hot dip galvanizing in Zn-0.20%Al, the $_{C-X}MnO.SiO_{2}$ (x>1) oxide film was also reduced and the amorphous $_{a-X}MnO.SiO_{2}$ and $a-SiO_{2}$ particles were embedded in the $Fe_{2}Al_{5-X}Zn_{X}$ inhibition layer formed at the steel/coating interface during hot dipping. The results clearly show that Al in the liquid Zn bath can reduce the crystalline $_{C-X}MnO.SiO_{2}$ (x>1) oxides but not the amorphous $_{a-X}MnO.SiO_{2}$ (x<0.9) and $a-SiO_{2}$ oxides. These oxides remain embedded in the Zn layer or in the inhibition layer, making it possible to apply a Zn or Zn-alloy coating on martensitic steel by hot dipping. The hot dipping process was also found to deteriorate the mechanical properties, independently of the Zn bath composition.

• 한국재료학회지
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• 제26권8호
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• pp.430-437
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• 2016

Aluminum oxide ($Al_2O_3$) thin films were grown by atomic layer deposition (ALD) using a new Al metalorganic precursor, dimethyl aluminum sec-butoxide ($C_{12}H_{30}Al_2O_2$), and water vapor ($H_2O$) as the reactant at deposition temperatures ranging from 150 to $300^{\circ}C$. The ALD process showed typical self-limited film growth with precursor and reactant pulsing time at $250^{\circ}C$; the growth rate was 0.095 nm/cycle, with no incubation cycle. This is relatively lower and more controllable than the growth rate in the typical $ALD-Al_2O_3$ process, which uses trimethyl aluminum (TMA) and shows a growth rate of 0.11 nm/cycle. The as-deposited $ALD-Al_2O_3$ film was amorphous; X-ray diffraction and transmission electron microscopy confirmed that its amorphous state was maintained even after annealing at $1000^{\circ}C$. The refractive index of the $ALD-Al_2O_3$ films ranged from 1.45 to 1.67; these values were dependent on the deposition temperature. X-ray photoelectron spectroscopy showed that the $ALD-Al_2O_3$ films deposited at $250^{\circ}C$ were stoichiometric, with no carbon impurity. The step coverage of the $ALD-Al_2O_3$ film was perfect, at approximately 100%, at the dual trench structure, with an aspect ratio of approximately 6.3 (top opening size of 40 nm). With capacitance-voltage measurements of the $Al/ALD-Al_2O_3/p-Si$ structure, the dielectric constant of the $ALD-Al_2O_3$ films deposited at $250^{\circ}C$ was determined to be ~8.1, with a leakage current density on the order of $10^{-8}A/cm^2$ at 1 V.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2007년도 하계학술대회 논문집 Vol.8
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• pp.403-404
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• 2007

We prepared the Al doped ZnO (AZO) thin film on polyethersulfon (PES) without any substrate heating by Facing Targets Sputtering (FTS) system. ZnO doped the content of Al 2 wt% was used and the sputtering conditions were gas pressure 1mTorr and input power 100W. The electrical, structural and optical properties of AZO thin films were investigated. To investigate the as-deposited thin film properties, we employed four-point probe, UV/VIS spectrometer, X-ray diffractometer (XRD), scanning electron microscopy (SEM), Hall Effect measurement system and Atomic Force Microscope (AFM).

• 한국진공학회:학술대회논문집
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• 한국진공학회 2014년도 제46회 동계 정기학술대회 초록집
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• pp.329.1-329.1
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• 2014

In this paper, we report electrical, optical and structural properties of Al-doped zinc oxide (AZO) thin films deposited at different substrate temperatures and pressures. The films were prepared by radio frequency (RF) magnetron sputtering on glass substrates in argon (Ar) ambient. The X-ray diffraction analysis showed that the AZO films deposited at room temperature (RT) and 20 Pa were mostly oriented along a-axis with preferred orientation along (100) direction. There was an improvement in resistivity ($3.7{\times}10^{-3}{\Omega}-cm$) transmittance (95%) at constant substrate temperature (RT) and working pressure (20 Pa) using the Hall-effect measurement system and UV-vis spectroscopy, respectively. Our results have promising applications in low-cost transparent electronics, such as the thin-film solar cells and thin-film transistors due to favourable deposition conditions. Furthermore our film deposition method offers a procedure for preparing highly oriented (100) AZO films.

• 한국자기학회지
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• 제13권1호
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• pp.36-40
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• 2003

D $y_{x}$B $i_{3-x}$F $e_{5}$ $O_{12}$(x=0.5,1.0,1.5,2.0) 가네트 박막을 sol-gel법의 일종인 Pechini법의 이용하여 $Al_2$ $O_3$, G $d_3$G $a_{5}$ $O_{12}$ (111) 평면에 성장시켰다. 단일 조성의 D $y_{x}$B $i_{3-x}$F $e_{5}$ $O_{12}$ 박막을 얻기 위한 열처리 온도는 기판의 종류에 의존하며, 박막과 같은 구조의 G $d_3$G $a_{5}$ $O_{12}$ (111) 기판의 경우 A1$_2$ $O_3$ 기판을 사용한 경우에 비해 단일 조성을 얻기 위한 열처리 온도가 약 5$0^{\circ}C$ 감소함을 알 수 있었다. G $d_3$G $a_{5}$ $O_{12}$ (111) 기판 위에 성장된 가네트 박막의 낟알들은 대부분 기판과 같은 [111] 방향으로 정렬하며, 이 경우 박막의 자기 이력 곡선은 5000 Oe 이상에서도 포화 자기화에 도달하지 못하는 것으로 확인되었다. 이러한 현상의 원인으로 회전 자기화 과정 (rotation magnetization process)에 의한 것으로 추정하였다. Pechini 법으로 성장시킨 D $y_{x}$B $i_{3-x}$F $e_{5}$ $O_{12}$ 박막에서 단위 세포 당 최대 Bi 이온의 양은 2.0 이하임을 처음으로 확인하였고, 이는 LPE법에 의해 성장된 단결정 가네트의 경우에 알려진 최대 Bi이온의 양 2.3보다 작은 값이다.에 알려진 최대 Bi이온의 양 2.3보다 작은 값이다.은 값이다.

• 한국결정학회지
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• 제15권1호
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• pp.18-23
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• 2004

CaSe wurtzite 구조를 갖는 박막과 나노구조의 광특성을 조사하기 위하여, 99.99% CdSe 분말(Aldrich)을 $7{\times}10^{-6}$ torr 진공상태에서 $SiO_x$ 기판과 다공성 $AlO_x$ 형판 위에 평균 증착속도 1 ${\AA}$/sec로 증착하였다. 주사 전자현미경 분석법(SEM) 및 박막 X-선 회절분석법과 형광분석법에 의해서 확인한 결과, $AlO_x$ 형판을 주형으로 사용하여 얻은 CdSe 튜브의 직경은 약 200 nm이었고, $SiO_x$ 기판위에 형성된 CdSe 박막의 결정립의 크기는 약 2 nm이었으며 형광특성 실험결과와 일치하였다.

• The Korean Journal of Ceramics
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• 제5권4호
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• pp.368-370
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• 1999

Using DC faced target sputtering method we grow AIN the films on the $Al_2O_3$(0001) substrate with varying thickness(17$\AA$-1000$\AA$). We measured x-ray diffraction(XRD) profiles by synchrotron radiation($\lambda$=1.12839 $\AA$) with four circle diffractometer. The full width half maximum(FWHM) of rocking curve for the AIN (0002) diffraction of the film grown at $500^{\circ}C$ was $0.029^{\circ}$. Also, we confirmed that the stress between AIN thin film and $Al_2O_3$(0001) substrate was reduced as increasing AIN film thickness, and the critical thickness of 400~500 $\AA$, defined as a lattice constant in the film agrees with that in a bulk without stress, was obtained.

• 한국전기전자재료학회논문지
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• 제19권8호
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• pp.758-763
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• 2006

We has been studied the thin film encapsulation effect for organic light-emitting diodes (OLED). To evaluate the passivation properties of the passivation layer materials, we have carried out the fabrication of green light emitting diodes with ultra violet(UV) light absorbing polymer resin, $SiO_2,\;and\;SiN_x$, respectively. From the measurement results of shrinkage properties according to the exposure time to the atmosphere, we found that $SiN_x$ thin film is the best material for passivation layer. We have investigated the emission efficiency and life time of OLED device using the package structure of $OLED/SiN_x/polymer$ resin/Al/polymer resin. The emission efficiency of this OLED device was 13 lm/W and life time was about 2,000 hours, which reach 95 % of the performance for the OLED encapsulated with metal.

• 한국진공학회지
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• 제16권4호
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• pp.267-272
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• 2007

라디오파 마그네트론 스퍼터링 방법으로 유리 기판 위에 Al 도핑된 ZnO (AZO) 박막을 성장시켰다. 증착시 스퍼터링 가스로 사용하는 산소 유량비의 변화에 따른 AZO 박막의 특성을 X-선 회절법, 원자 주사 현미경, 홀 효과 측정법으로 조사하였다. 증착 온도 $400^{\circ}C$에서 산소 유량비 0%로 증착된 AZO 박막은 가장 큰 c-축 우선 배향성과 최저의 비저항값 $6.9{\times}10^{-4}{\Omega}cm$을 나타내었다. 산소 유량비가 증가함에 따라 ZnO (002)면의 회절 피크의 세기는 실질적으로 감소하는 경향을 보였다. 또한, 산소 유량비가 감소함에 따라 전하 운반자의 농도와 홀 이동도는 증가하였으나, 전기 비저항은 감소하였다.