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http://dx.doi.org/10.4313/JKEM.2006.19.8.758

Passivation Properties of SiNx Thin Film for OLEO Device  

Ju Sung-Hoo (대진대학교 신소재공학과)
Publication Information
Journal of the Korean Institute of Electrical and Electronic Material Engineers / v.19, no.8, 2006 , pp. 758-763 More about this Journal
Abstract
We has been studied the thin film encapsulation effect for organic light-emitting diodes (OLED). To evaluate the passivation properties of the passivation layer materials, we have carried out the fabrication of green light emitting diodes with ultra violet(UV) light absorbing polymer resin, $SiO_2,\;and\;SiN_x$, respectively. From the measurement results of shrinkage properties according to the exposure time to the atmosphere, we found that $SiN_x$ thin film is the best material for passivation layer. We have investigated the emission efficiency and life time of OLED device using the package structure of $OLED/SiN_x/polymer$ resin/Al/polymer resin. The emission efficiency of this OLED device was 13 lm/W and life time was about 2,000 hours, which reach 95 % of the performance for the OLED encapsulated with metal.
Keywords
OLEO; Encapsulation; Thin film; Passivation; Life time;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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