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Sung-Hwa Lim, "User Experience Assisted Energy-Efficient Software Design for Mobile Devices on the big.LITTLE Core Architecture," Journal of the Semiconductor & Display Technology, Vol. 19, No. 1, pp.23- 28, 2021./
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Byeong-Gil Lee, Minseok Byun, Yeojin Kim and Jonghwan Lee, "Determination of Optimal Buffer Size for Semiconductor Production System using Harmony Search Algorithm", Journal of the Semiconductor & Display Technology, v.19, n.4, pp.39-45, 2021/
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T. Cho, "Detection of PCB Components Using Deep Neural Nets," Journal of the Semiconductor & Display Technology, Vol. 19, No. 2. pp. 11-15, 2020./
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Lee, Y. H. and Y. S. Kim(2020), Comparison of CNN and YOLO for Object Detection, Journal of the Semiconductor and Display Technology, Vol. 19, No. 1, pp. 85-91./
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Chang-Hee Yang, Kyu-Sub Park, Young-Sub Kim and Yong-Hwan Lee, "Comparative Analysis for Emotion Expression Using Three Methods Based by CNN" J. of The Korea Society of Semiconductor & Display Technology, Vol.19, pp.65-70, 2020./
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Song-Yeon Lee and Yong-Jeong Huh, "A Study on Square Pore Shape Discrimination Model of Scaffold Using Machine Learning Based Multiple Linear Regression", J. of The Korean Society of Semiconductor & Display Technology, Vol.19, pp. 59-64, 2020./
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Song-Yeon Lee and Yong-Jeong Huh, "A Study on Prediction Model Performance of Scaffold Pore Size Using Machine Learning Regression Method", J. of The Korean Society of Semiconductor & Display Technology, Vol.19, pp. 36-41, 2020./
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Lee, J., and Park. J., "Fabrication of Cylindrical Microlens Using Slot-die Coating and Thermal Reflow Method", J. of The Korean Society of Semiconductor & Display Technology, Vol. 19, pp. 30-35, 2020./
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Sung-Soo Hong and Jung-Hee Han, "Semiconductor Process Inspection Using Mask R-CNN", J. of The Korea Society of Semiconductor & Display Technology, Vol.19, pp.12-18, 2020./
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Chang-Hee Yang, Kyu-Sub Park, Young-Sub Kim and Yong-Hwan Lee, "Comparative Analysis for Emotion Expression Using Three Methods Based by CNN", J. of The Korea Society of Semiconductor & Display Technology, Vol.19, pp.65-70, 2020./
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