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1 H. J. Kim, J. H. Seo, D. W. Kim, M. Y. Lee, and L. S. Seo, J. Kor. Mag. Soc. 23, 26 (2013)./   DOI   Ndsl View Article
2 H. J. Kim, J. H. Seo, W. Y. Lee, J. K. Yeom, L. S. Seo, and M. Y. Lee, Proc. of the KMS Summer Conference (2013) p. 66./ View Article
3 Incropera, F. P., Lavine, A. S., Bergman, Ttheodore L., and DeWitt, David P., Wiley, NewYork (2013) pp. 156-158./ View Article
4 H. S. Jae, S. S. Lee, and M. Y. Lee, Proc. of the KSME Spring Annual Meeting (2013) pp. 268-270./ View Article
5 H. Wang, Z. D. Zhang, R. Wu, and L. Z. Sun, Acta Mater. 61, 2919 (2013)./   DOI   Ndsl View Article
6 D. H. Nam, W. B. Lee, Y. S. Hong, and S. S. Lee, Sensors 13, 4714 (2013)./   DOI   Ndsl View Article
7 D. H. Lee, MS Thesis in Dept. of Applied Electrical Engineering, Sangji University 2013. Aug./ View Article
8 D. H. Nam, W. B. Lee, Y. S. Hong, and S. S. Lee, Sensors 13, 4714 (2013)./   DOI   Ndsl View Article
9 J. H. Seo and M. Y. Lee, J. Kor. Academia-Industrial Cooperation Soc. 14, 997 (2013)./   DOI   Ndsl View Article
10 J.-S. Kang, J. Hwang, D. H. Kim, E. Lee, W. C. Kim, C. S. Kim, H.-K. Lee, J.-Y. Kim, S. W. Han, S. C. Hong, Bongjae Kim, and B. I. Min, J. Appl. Phys. 113, 17E116 (2013)./   DOI View Article