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1 T. Suzuki et al., Appl. Phys. Express 4, 023003 (2011)./   DOI View Article
2 C. H. Li et al., Nature Comm. 2, 245 (2011)./   DOI   Ndsl View Article
3 S. P. Dash et al., ArXiv 1101.1691 (2011)./ View Article
4 S. S. Lee, D. H. Nam, Y. S. Hong, W. B. Lee, I. H. Son, K. H. Kim, and J. G. Choi, Sensors 11, 1784 (2011)./   DOI View Article
5 P. K. Muduli, O. G. Heinonen, and J. Åkerman, Phys. Rev. B 83, 184410 (2011)./   DOI   Ndsl View Article
6 C.-Y. You, J. Yoon, S.-Y. Park, S. Yuasa, and M. H. Jung, Curr. Appl. Phys. DOI:10.1016/j.cap.2010.11.128 (2011)./   DOI   Ndsl View Article
7 S. Y. Jang, C.-Y. You, S. H. Lim, and S. R. Lee, J. Appl. Phys. 109, 013901 (2011)./   DOI   Ndsl View Article
8 J. G. Choi, D. G. Hwang, J. R. Rhee, and S. S. Lee, Thin Solid Films, In Press (2011)./ View Article
9 H. S. Kim, J. D. Lee, S. Y. Jeong, C. H. Lee, and S. J. Suh, J. Kor. Magn. Soc. 21, 151 (2011)./   DOI   Ndsl View Article
10 J.-C. Lee, K.-J. Kim, J.-S. Ryu, K.-W. Moon, S.-J. Yun, G.-H. Gim, K.-S. Lee, K.-H. Shin, H.-W. Lee, and S.-B. Choe, Phys. Rev. Lett. 107, 067201 (2011)./   DOI View Article