| 1 |
K. Nishikawa, S. Ogata, T. Syoyama, W. S. Cho, T. S. Yoon, M. Tsunoda and M.Takahashi, Journal of Magnetics, 7, 63 (2002)/
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| 2 |
G.S.Park, P.W.Chang and Y.W.Rho, 'Optimum Design of the Non-Destructive Testing System to Maximize the Magnetic Flux Leakages', Journal of Magnetics, Vol.6, No.1, pp.31-35, March 2001/
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| 3 |
null/
[[T.S.Kim;K.C.Kim;Kibo Kim;K.Koh;Y.J.Song;Y.S.Kim;S.J.Suh;Y.S.Kim]] / null
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| 4 |
null/
[[S.J.Kang;K.Y.Kim;W.T.Ye;J.Lee]] / null
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| 5 |
null/
[[K.Nishikawa;S.Ogata;T.Syoyama;W.S.Cho;T.S.Yoon.;M.Tsunoda;M.Takahashi]] / null
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