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http://dx.doi.org/10.21218/CPR.2017.5.2.055

Optical Characteristics of Nanocone-patterned c-Si Wafers Coated with Dielectric Thin Films  

Kim, Eunah (Department of Physics, Ewha Womans University)
Park, Jimin (Department of Physics, Ewha Womans University)
Ko, Eun-Ji (Department of Physics, Ewha Womans University)
Kim, Dong-Wook (Department of Physics, Ewha Womans University)
Publication Information
Current Photovoltaic Research / v.5, no.2, 2017 , pp. 55-58 More about this Journal
Abstract
We investigated the influences of dielectric thin film coating on the optical characteristics of c-Si wafers with nanocone (NC) arrays using finite-difference time-domain (FDTD) simulations. Dielectric thin films on high-refractive-index surface can lower optical reflection and reflection dips appear at the wavelengths where destructive interference occurs. The optical reflection of the NC arrays was lower than that of the dielectric-coated planar wafer in broad wavelength range. Remarkable antireflection effects of the NC array could be attributed to beneficial roles of the NCs, including the graded refractive index, multiple reflection, diffraction, and Mie resonance. Dielectric thin films modified the optical reflection spectra of the NC arrays, which could not be explained by the interference alone. The optical properties of the dielectric-coated NC arrays were determined by the inherent optical characteristics of the NC arrays.
Keywords
Antireflection; c-Si; Nanocone; Dielectric;
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Times Cited By KSCI : 1  (Citation Analysis)
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