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http://dx.doi.org/10.21218/CPR.2017.5.2.047

HIT PV Module Performance Research for an Improvement of Long-term Reliability: A Review  

Park, Hyeong Sik (Electronics Convergence Materials & Devices Research Center, Korea Electronics Technology Institute (KETI))
Jeong, Jae-Seong (Electronics Convergence Materials & Devices Research Center, Korea Electronics Technology Institute (KETI))
Park, Chang Kyun (Crystalline Part, JUSUNG Engineering Co. Ltd.)
Lim, Kyung Jin (Crystalline Part, JUSUNG Engineering Co. Ltd.)
Shin, Won Seok (Crystalline Part, JUSUNG Engineering Co. Ltd.)
Kim, Yong Jun (College of Information and Communication Engineering, Sungkyunkwan University)
Kang, Jun Young (College of Information and Communication Engineering, Sungkyunkwan University)
Kim, Young Kuk (College of Information and Communication Engineering, Sungkyunkwan University)
Park, No Chang (Electronics Convergence Materials & Devices Research Center, Korea Electronics Technology Institute (KETI))
Nam, Sang-Hun (Department of Chemistry, Sungkyunkwan University)
Boo, Jin-Hyo (Department of Chemistry, Sungkyunkwan University)
Yi, Junsin (College of Information and Communication Engineering, Sungkyunkwan University)
Publication Information
Current Photovoltaic Research / v.5, no.2, 2017 , pp. 47-54 More about this Journal
Abstract
We report finding ways to improve the long-term reliability of PV module including the heterostructure with the intrinsic thin layer (HIT) solar cell. We point out the stability of the products of Panasonic HIT cell. We account for a brief description of the module manufacturing process to investigate the issues of each process and analyze the causes. We carried out the silicon PV module of the glass to glass type under the damp heat test around 1000 hours. However, it degraded around 7% of PV module power after 300 hours exposure in comparison with the initial status (Initial: 12.7 Watt). We investigated possible cause and solutions for the module performance to develop the long-term reliability.
Keywords
PV module; Reliability; HIT; Long-term lifetime; High-efficiency;
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