1 |
M. Hecker, E. Thiele, C. Holste, "X-ray diffraction analysis of internal stresses in the dislocation structure of cyclically deformed nickel single crystals", M. Hecker et al./Materials Science and Engineering A 234-236 (1997) 806&809
DOI
|
2 |
W Qin, T Nagase, "Lattice distortion and its effects on physical properties of nanostructured materials", JOURNAL OF PHYSICS: CONDENSED MATTER, J. Phys.: Condens. Matter 19 (2007) 236217 (8pp)
DOI
|
3 |
Green MA, Emery K, Hishikawa Y, Warta W, DunlopED. "Solar cell efficiency tables (version 39)", Progressin Photovoltaics. Research and Applications 2012; 20:12-20
DOI
|
4 |
Green MA, Emery K, Hishikawa Y, Warta W. "Solarcell efficiency tables (version 33). Progress in Photovoltaics", Research and Applications 2009; 17:85-94.
DOI
|
5 |
Green MA, Emery K, Hishikawa Y, Warta W, DunlopED. "Solar cell efficiency tables (version 45)", Progressin Photovoltaics, Research and Applications 2015; 23:1-9.
DOI
|
6 |
PV Magazine. "First Solar raises bar for CdTe with21.5% efficiency record", 6 February 2015.
|
7 |
Eiji Kobayashi, Yoshimi Watabe, "High efficiency heterojunction solar cells on n-type kerfless mono crystalline silicon wafers by epitaxial growth", APPLIED PHYSICS LETTERS 106, 223504 (2015)
DOI
|
8 |
Green, Martin A., et al. Solar cell efficiency tables (version 50). Progress in Photovoltaics, Research and Applications 25.7 (2017): 668-676.
DOI
|
9 |
Solibro Press Release. "Solibro beats world record forsolar cells", dated 12 June 2014.
|
10 |
"ITRV 2014 International Technology Roadmap for Photovoltaic sixth edition" April 2015, revision July 2015
|
11 |
W. Kaiser, Phys. Rev. 105, 1751 (1957).
DOI
|
12 |
W. Kaiser, H. L. Frisch, and H. Reiss, Phys. Rev. 112, 1546 (1958).
DOI
|
13 |
Suo, Z. "Singularities interacting with interfaces and cracks". Inl. J. Solids Struct. (1989); MS 599.
|
14 |
V. L. indenbom, V. M. Kaganer, "X-Ray Analysis o f Internal Stresses in Crystals II. Lattice Distortions Due to Residual Strains in Crystals Grown from Melts", PSS,Volume 122, Issue 1 16 November (1990) Pages 97-109
|
15 |
M. Hecker, E. Thiele, C. Holste, "X-ray diffraction analysis of internal stresses in the dislocation structure of cyclically deformed nickel single crystals", M. Hecker et al./Materials Science and Engineering A 234-236 (1997) 806&809
DOI
|
16 |
James D. Rachwal. "X-ray diffraction applications in thin films and (100) silicon substrate stress analysis"
|
17 |
ZHIGANG Suo, JOHN W. HUTCHINSON. "STEADYSTATE CRACKING IN BRITTLE SUBSTRATES BENEATH ADHERENT FILMS". Int. J. Solids Structures (1989) ; Vol. 25, No. 11, pp. 1337-1353.
DOI
|
18 |
M. D. DRORY, M. D. THOULESS, A. G. EVANS. (1988); Acta metall. Vol. 36, No. 8, pp. 2019-2028.
DOI
|
19 |
Suo, Z, Hutchinson, J. W. "Interface crack between two elastic layers". Int. J. Fracture. (l989).
|
20 |
Evans A. G, Hutchinson J. W. "On the mechanics of delamination and spalling in compressed films". Int. J. Solids Struct. (1984); 20,455-466
DOI
|
21 |
Joost Vlassak, Thin Film Mechanics, DEAS Harvard University, (2004); AP 298r Spring 2004
|
22 |
Alireza Moridi, L.C Zhang, Mei Liu, "Residual stresses in thin film systems : Effects of lattice mismatch thermal mismatch and interface dislocations", IJSS 50, (2013) 3562-3569
|
23 |
V. L. indenbom, V. M. Kaganer, "X-Ray Analysis of Internal Stresses in Crystals II. Lattice Distortions Due to Residual Strains in Crystals Grown from Melts", PSS,Vol 122, Issue 1. (1990) 16 November P97-109
|
24 |
James D. Rachwal, "X-ray diffraction applications in thin films and (100) silicon substrate stress analysis, Scholar Commons Citation", (2010), p44-p46
|
25 |
C. T. SUN, C. J. JIH. "ON STRAIN ENERGY RELEASE RATES FOR INTERFACIAL CRACKS IN BI-MATERIAL MEDIA". Enginecnng Fracture Mechanics Vol. 28, No. 1. (1987) pp. 13-20
DOI
|
26 |
Bedell, S. W., et al. "Layer transfer of bulk gallium nitride by controlled spalling." Journal of Applied Physics 122.2 (2017): 025103.
DOI
|
27 |
Bedell, Stephen W., et al. "Kerf-less removal of Si, Ge, and III-V layers by controlled spalling to enable low-cost PV technologies." IEEE Journal of Photovoltaics 2.2 (2012): 141-147.
DOI
|
28 |
N. Nakamura, K. Hashimoto, E. Kobayashi, and Y. Watabe in Proceedings of the 27th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC), Frankfurt, Germany (2012), p. 1556.
|
29 |
J.C. Hoogvliet, W.P. van Bennekom, "Gold thin-film electrodes: an EQCM study of the influence of chromium and titanium adhesion layers on the response", Electrochimica Acta 47 (2001) 599-611
DOI
|
30 |
Gary Richardson, "Measurement of residual stress in electrodeposited nickel films", Rochester Institute of Technology RIT Scholar Works, p40-p43
|
31 |
M. Saitou, "Scaling behavior of internal stress in electrodeposited nickel thin films", JOURNAL OF APPLIED PHYSICS 104, 093518 (2008)
DOI
|
32 |
W Qin, T Nagase, "Lattice distortion and its effects on physical properties of nanostructured materials", JOURNAL OF PHYSICS: CONDENSED MATTER, J. Phys.: Condens. Matter 19 (2007) 236217 (8pp)
DOI
|
33 |
V. L. indenbom, V. M. Kaganer, "X-Ray Analysis of Internal Stresses in Crystals II. Lattice Distortions Due to Residual Strains in Crystals Grown from Melts", PSS,Volume 122, Issue 1 16 November (1990) Pages 97-109
|