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http://dx.doi.org/10.4191/kcers.2017.54.6.05

Effect of Working Pressure and Substrate Bias on Phase Formation and Microstructure of Cr-Al-N Coatings  

Choi, Seon-A (Department of Engineering Ceramic Center, Korea Institute of Ceramic and Engineering Technology)
Kim, Seong-Won (Department of Engineering Ceramic Center, Korea Institute of Ceramic and Engineering Technology)
Lee, Sung-Min (Department of Engineering Ceramic Center, Korea Institute of Ceramic and Engineering Technology)
Kim, Hyung-Tae (Department of Engineering Ceramic Center, Korea Institute of Ceramic and Engineering Technology)
Oh, Yoon-Suk (Department of Engineering Ceramic Center, Korea Institute of Ceramic and Engineering Technology)
Publication Information
Abstract
With different working pressures and substrate biases, Cr-Al-N coatings were deposited by hybrid physical vapor deposition (PVD) method, consisting of unbalanced magnetron (UBM) sputtering and arc ion plating (AIP) processes. Cr and Al targets were used for the arc ion plating and the sputtering process, respectively. Phase analysis, and composition, binding energy, and microstructural analyses were performed using X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and field emission scanning electron microscopy (FESEM), respectively. Surface droplet size of Cr-Al-N coatings was found to decrease with increasing substrate bias. A decrease of the deposition rate of Cr-Al-N films was expected due to the increase of substrate bias. The coatings were grown with textured CrN phase and (111), (200), and (220) planes. X-ray diffraction data show that all Cr-Al-N coatings shifted to lower diffraction angles due to the addition of Al. The XPS results were used to determine the $Cr_2N$, CrN, and (Cr,Al)N binding energies. The compositions of the Cr-Al-N films were measured by XPS to be Cr 23.2~36.9 at%, Al 30.1~40.3 at%, and N 31.3~38.6 at%.
Keywords
Cr-Al-N; Hard coating; Hybrid physical vapor deposition; Arc ion plating; Unbalanced magnetron sputtering;
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Times Cited By KSCI : 3  (Citation Analysis)
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