A Study of the Memory Characteristics of Al2O3/Y2O3/SiO2 Multi-Stacked Films with Different Tunnel Oxide Thicknesses |
Jung, Hye Young
(Department of Materials Science and Engineering, Yonsei University)
Choi, Yoo Youl (Department of Materials Science and Engineering, Yonsei University) Kim, Hyung Keun (Department of Materials Science and Engineering, Yonsei University) Choi, Doo Jin (Department of Materials Science and Engineering, Yonsei University) |
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