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http://dx.doi.org/10.4191/KCERS.2006.43.12.805

Effect of Oxidation of Ni on the Microstructure of Ni/YSZ Anode and Crack Formation in YSZ Electrolyte Layer for SOFC  

Lim, Jun-Sil (LG Philips LCD Co., Ltd.)
Choi, Jong-Joon (LG Philips LCD Co., Ltd.)
Kwon, Oh-Jong (Department of Materials Science and Metallurgy, Kyungpook National University)
Publication Information
Abstract
The microstructural changes in Ni/YSZ anode substrate and crack formation during Ni oxidation were investigated. The composition of as-sintered anodes was 56 wt% NiO+44 wt% YSZ and that of electrolyte was 8 mol% yttria. After complete reduction, specimens were oxidized in $N_2$ + air at $600\sim800^{\circ}C$. Oxygen partial pressure was controlled in between 0.05 atm and 0.2 atm $O_2$. When the anode was oxidized, at higher than $690^{\circ}C$, three layers were formed in the specimens. The first was fully oxidized layer(NiO/YSZ), the second was a mixed layer and the third, near-intact layer. Under $640^{\circ}C$ such distinctive layers were not observed. Cracks formed at electrolyte layer when weight gain attained at $65\sim75%$ of the total gain due to complete oxidation despite of different oxidation temperature and oxygen partial pressure.
Keywords
SOFC; Ni/YSZ anode; YSZ electrode; Oxidation; Crack formation;
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