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http://dx.doi.org/10.4191/KCERS.2004.41.6.450

Deposition Properties of NiCr Thin Films Prepared by Thermal Evaporation  

Kun, Yong (Department of Advanced Materials Engineering, Chosun University)
Park, Yong-Ju (Department of Advanced Materials Engineering, Chosun University)
Choi, Seoung-Pyung (Department of Physics, Chosun University)
Jung, Jin (Department of Physics, Chosun University)
Choi, Gwang-Pyo (Research Institute of Energy Resources Technology, Chosun University)
Ryu, Hyun-Wook (Research Institute of Energy Resources Technology, Chosun University)
Park, Jin-Seong (Department of Advanced Materials Engineering, Chosun University)
Publication Information
Abstract
NiCr thin films were fabricated by thermal evaporation method using NiCr alloy as evaporating source. NiCr thin films were annealed at various temperatures in air atmosphere in order to investigate effects of annealing conditions on phase change, composition, and microstructures of NiCr films. Typical multilayer was formed after annealing in air atmosphere. This results from the diffusion and oxidation of Cr toward surface during annealing. In the case of annealing at 700$^{\circ}C$, large columnar grains of NiO were formed on Cr-oxide layer through the diffusion and oxidation of Ni over Cr-oxide layer. Especially, NiO layer was formed additionally on surface, sustaining the underlayer structure with the formation of porous Ni layer.
Keywords
NiCr thin film; Themal evaporation; Auger depth profile; Diffusion; Oxidation;
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