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http://dx.doi.org/10.4191/KCERS.2004.41.11.851

Stabilization of Heavy Metals in Glasses Containing EAF Dust  

Eun, Hee-Tai (경기대학교 첨단산업공학부 신소재공학과)
Kang, Seung-Gu (경기대학교 첨단산업공학부 신소재공학과)
Kim, Yoo-Taek (경기대학교 첨단산업공학부 신소재공학과)
Lee, Gi-Kang (경기대학교 첨단산업공학부 신소재공학과)
Kim, Jung-Hwan (경기대학교 첨단산업공학부 신소재공학과)
Publication Information
Abstract
The stabilizing characteristics of heavy metals in the silicate glass (SD), borosilicate glass (BD), and leadsilicate glass (PD) containing Electric Arc furnace (EAF) dust were studied by the Toxic Characterization Leaching Procedure (TCLP) test. Also, the dependence of the amount of EAF dust upon structural changes of SD, BD, and PD glasses and the TCLP results were investigated by the XRD and FT-IR spectroscopy. In the XRD results, all of SD, BD, and PD specimens containing dust up to 30 wt% were amorphous without crystallizing. In the TCLP test, the concentration of heavy metals leached from the glasses increased with the amount of EAF dust added. The SD specimen series showed the lowest heavy metal leaching and the heavy metal leachate of the PD specimens were lower than those of the BD specimens. But, the Pb leaching from the PD specimens was the highest in the PD glass composition due to the high Pb content. The value of oxygen/network former ratio could be used to compare the chemical durability within the same glass series, but not proper to do between the different glass series. Adding the EAF dust to the SD mother glass, decreased the Si-O-Si symmetry and increased the non-bridging oxygen, which weakened the structure and decreased the chemical durability of glasses. In the BD series glasses, the addition of EAF dust caused the structural changes from tetra-borate group to di-borate group and the formation of the 2-dimensional layer structure of pyre- and ortho- borate, which decreased the chemical durability of glasses. It is concluded that SD series glass among the 3 kinds of glasses is the most effective to stabilize the heavy metals of EAF dust.
Keywords
Heavy metal stabilization; EAF duet; Glass frit; TCLP text; XRD and FT-IR;
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Times Cited By KSCI : 1  (Citation Analysis)
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