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http://dx.doi.org/10.4191/KCERS.2003.40.1.046

A Study on fabrication of Ferroelectric SBT Thin Films by Liquid Delivery MOCVD Process  

강동균 (고려대학교 재료공학과)
백승규 (고려대학교 재료공학과)
송석표 (고려대학교 재료공학과)
김병호 (고려대학교 재료공학과)
Publication Information
Abstract
Ferroelectric $Sr_{0.7}Bi_{2.1}Ta_{2.0}O_9$ thin films with 200 nm thicknesses were deposited on $Pt/Ti/SiO_2/Si$ substrate by liquid delivery MOCVD process. In these experiments, $Sr(TMHD)_2{\cdot}pmdeta,\; Bi(ph)_3$ and $Ta(O^i/Pr)_4(TMHD)$ were used as precursors, which were dissolved in n-butyl acetate and pentamethyldiethylenetriamine. Substrate temperature and reactor pressure of this experiment was $570^{\circ}C$and 5 Torr, respectively. The remanent polarization value (2Pr) of SBT thin film with annealed at $780^{\circ}C$was$7.247{\mu}C/cm^2$and$8.485 {\mu}C/cm^2$by applying 3 V and 5 V, respectively.
Keywords
MOCVD; SBT; Ferroelectric;
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  • Reference
1 Metalorganic Chemical Vapor Deposition of Ferroelectric <TEX>$SrBi_2Ta_2O_9$</TEX> Thin Film /
[ T. Li;Y. Zhu;S. B. Desu ] / Appl. Phys. Lett.   DOI
2 A Study on Low-temperature Crystallization of <TEX>$SrBi_2Ta_2O_9$</TEX> Thin Films Prepared by Sol-gel Method Using Steam Curing Process /
[ Y. Sawada;H. Kobari;Y. Sato;A. Hashimoto;I. Koiwa;H. Kobayashi;T. Osaka ] / Integrated Ferroelectrics   DOI   ScienceOn
3 Growth and Characterization of <TEX>$SrBi_2Nb_2O_9$</TEX> Thin Films by Pulsed Laser Ablation /
[ S. Bhattacharyya;S. S. N. Bharadwaja ] / Appl. Phys. Lett.   DOI
4 Integration Aspects and Electrical Properties of <TEX>$SrBi_2Ta_2O_9$</TEX> for Non-volatile Memory Applications /
[ D. J. Taylor;R. E. Jones;Y. T. Lii;P. Zurcher;P. Y. Chu;S. J. Gillespie ] / Mat. Res. Soc. Symp. Proc.   DOI
5 Low Temperature Process for Strontium Bismuth Tantalate Thin Films /
[ J. Celinska;V. Joshi;S. Narayan;L. D. McMillan;C. A. Paz De Araujo ] / Integrated Ferroelectrics   DOI   ScienceOn
6 /
[ Y. Xu ] / Ferroelectric Thin Films in Ferroelectric Materials and their Applications
7 Organometallic Chemical Vapor Deposition of Strontium Titanate /
[ W. A. Feil;B. W. Wessels;L. M. Tonge;T. J. Marks ] / J. Appl. Phys.   DOI
8 Evaluation of Imprint Properties in Sol-gel Ferroelectric<TEX>$Pb(Zr,Ti)O_3$</TEX> /
[ T. Mihara;H. Watanabe;C. A. Paz de Araujo ] / Jpn. J. Appl. Phy.   DOI
9 A Critical Comparative Review of PZT and SBT-based Science and Technology for Non-volatile Ferroelectric Memories /
[ O. Auciello ] / Integrated Ferroelectrics   DOI   ScienceOn
10 Characteristics of Bismuths Layered<TEX>$SrBi_2Ta_2O_9$</TEX>Thin-film Capacitors and Comparison with <TEX>$Pb(Zr,Ti)O_3$</TEX> /
[ T. Mihara;H. Yosimori;H. Watanabe;C. A. Paz de Araujo ] / Jpn. J. Appl. Phys.   DOI
11 Single-crystal <TEX>$Pb(Zr_xTi_{1-x})O_3$</TEX> Thin Films Prepared by Metal-organic Chemical Vapor Deposition : Systematic Compositional Variation of Electronic and Optical Properties /
[ Foster, C. M.(et al.) ] / J. Appl. Phys.   DOI   ScienceOn
12 Fatiguefree Ferroelectric Capacitors with Platinum Electrode /
[ C. A-Paz de Araujo;J. D. Cuchiaro;L. D. McMillan;M. C. Scott;J. F. Scott ] / Nature   DOI   ScienceOn