Browse > Article
http://dx.doi.org/10.4191/KCERS.2002.39.3.222

Strain Analysis for Quality Factor oft he Layered Mg0.93Ca0.07TiO3-(Ca0.3Li0.14Sm0.42)TiO3 Ceramics at Microwave Frequencies  

Cho, Joon-Yeob (Department of Ceramic Engineering, Yonsei University)
Yoon, Ki-Hyun (Department of Ceramic Engineering, Yonsei University)
Kim, Eung-Soo (Department of Materials Engineering, Kyonggi University)
Publication Information
Abstract
Microwave dielectric properties of the layered and functionally graded materials (FGMs) of $Mg_{0.93}Ca_{0.07}TiO_3$ (MCT) and $(Ca_{0.3}Li_{0.14}Sm_{0.42})TiO_3$(CLST) were investigated as a function of the volume ratio of two components. Dielectric constant was decreased with an increase of the volume ratio of MCT which had a lower dielectric constant thant CLST. For the layered FGMs specimens, the difference of thermal expansion coefficients between two components induced thermal strain to dielectric layers, which was confirmed by the plot of ${\Delta}$k (X-ray diffraction peak width0 versus k (scattering vector) using the double-peak Lorentzian function, f(x). Quality factor of the specimens was affected by the thermal strain of dielectric layer, especially MCT layer. For the specimen with the volume ratio of MCT/CLST = 2, the qulaity factor of the specimen showed a minimum value due to the maximum thermal strain fo MCT layer.
Keywords
$Mg_{0.93}Ca_{0.07}TiO_3$; $(Ca_{0.3}Li_{0.14}Sm_{0.42})TiO_3$; Quality factor; Thermal strain; Diffraction peak width ${\Delta}$k;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
1 Y. Takao, M. Awano, Y. Kuwahara and Y. Murase, 'Prepa-ration of a Multilayer and a Compositional Gradient Layer Composite by the Aerosol Filtration Method,' J. Mat. Res., 9 [8] 2128-32 (1994)   DOI   ScienceOn
2 D. C. Woo, H. Y. Lee, J-H. Han, T-H. Kim and T-G. Choy, 'Effect of Dopants on the Microwave Dielectric Properties of(1-x)MgTi0$_3$-xCaTiO$_3$ Ceramics,' J. Kor. Ceram. Soc., 34 [8] 843-53 (1997)
3 K. H. Yoon, D, P. Kim and E. S. Kim, 'Effect of BaWO$_4$ on the Microwave Dielectric Properties of Ba(Mg$_{1/3}$Ta$_{2/3}$)0$_3$ Ceramics,' J. Am. Ceram. Soc., 77 [4] 1062-66 (1994)   DOI   ScienceOn
4 R. Poddar and M. A. Brooke, 'Accurate High Speed Empiri-cally Based Predictive Modeling of Deeply Embedded Grid-ded Parallel Plate Capacitors Fabhcated in a Multilayer LTCC Process,' IEEE Trans. Adv. Packag., 22 [1] 26-31 (1999)   DOI   ScienceOn
5 E. Suhir, 'Predicted Thermal Stresses in a Bimaterial Assembly Adhesively Bonded at the Ends,' J. Appt. Phys., 89 [1] 120-29 (2000)
6 M. A. Rouf, A. H. Cooper and H. B. Bell, 4553 and 5380 in Phase Diagram for Ceramist, Edited by E. M. Levin, American Ceramic Society, Ohio, 1969
7 V. M. Ferreira, F. Azough, R. Freer and J. L. Baptista, 'The Effect of Cr and La on MgTiOg and MgTiO$_3$-CaTiO$_3$ Micro-wave Dielectric Ceramics,' J. Mat. Res., 12 [12] 3293-99 (1997)   DOI   ScienceOn
8 B. E. Warren, X-ray Diffraction, 2nd Ed., p251, Addison Wesley, Reading MA, 1969
9 B. D. Cullity, Elements of X-ray Diffraction, 2nd Ed., p285, Addison-wesley, Reading MA, 1978
10 B. F. Sorensen. S. Sarraute, O. Jergensen and A. Horsewell 'Thermally Induced Delamination of Multilayers,' Acta Mat., 46 [8] 2603-15 (1998)   DOI   ScienceOn
11 B. W. Hakki and P. D. Coleman, 'A Dielectric Method of Measuring Inductive Capacitance in the Millimeter Range,' IEEE Trans. Microwave Theory Tech., 8 402-10 (1960)   DOI
12 W. Chang, J. S. Horwitz, A. C. Carter, J. M. Pond, S. W. Kirchoefer, C. M. Gilmore and D. B. Chrisey, 'The Effect of Annealing on the Microwave Properties of Ba$_{0.5}$ ,Sr$_{0.5}$ r,TiO$_3$ Thin Fi\ms,' Appt. Phys. Lett., 74 [7] 1033-35 (1999)   DOI   ScienceOn
13 Y. Kim, J. Oh, T-G. Kim and B. Park, 'In Quence of the Microstructures on the Dielectric Properties of ZrTiO$_4$ Thin Films at Microwave-frequency Range,' Jpn. J. Appt. Phys., 40 [7] 4599-03 (2001)   DOI
14 T. Kim, J. Oh, B. Park and K. S. Hong, 'Correlation between Strain and Dielectric Properties in ZrTiO$_4$ Thin Films,' Appt. Phys. Lett., 76 [21] 3043-45 (2000)   DOI   ScienceOn