1 |
Y. Takao, M. Awano, Y. Kuwahara and Y. Murase, 'Prepa-ration of a Multilayer and a Compositional Gradient Layer Composite by the Aerosol Filtration Method,' J. Mat. Res., 9 [8] 2128-32 (1994)
DOI
ScienceOn
|
2 |
D. C. Woo, H. Y. Lee, J-H. Han, T-H. Kim and T-G. Choy, 'Effect of Dopants on the Microwave Dielectric Properties of(1-x)MgTi0-xCaTiO Ceramics,' J. Kor. Ceram. Soc., 34 [8] 843-53 (1997)
|
3 |
K. H. Yoon, D, P. Kim and E. S. Kim, 'Effect of BaWO on the Microwave Dielectric Properties of Ba(MgTa)0 Ceramics,' J. Am. Ceram. Soc., 77 [4] 1062-66 (1994)
DOI
ScienceOn
|
4 |
R. Poddar and M. A. Brooke, 'Accurate High Speed Empiri-cally Based Predictive Modeling of Deeply Embedded Grid-ded Parallel Plate Capacitors Fabhcated in a Multilayer LTCC Process,' IEEE Trans. Adv. Packag., 22 [1] 26-31 (1999)
DOI
ScienceOn
|
5 |
E. Suhir, 'Predicted Thermal Stresses in a Bimaterial Assembly Adhesively Bonded at the Ends,' J. Appt. Phys., 89 [1] 120-29 (2000)
|
6 |
M. A. Rouf, A. H. Cooper and H. B. Bell, 4553 and 5380 in Phase Diagram for Ceramist, Edited by E. M. Levin, American Ceramic Society, Ohio, 1969
|
7 |
V. M. Ferreira, F. Azough, R. Freer and J. L. Baptista, 'The Effect of Cr and La on MgTiOg and MgTiO-CaTiO Micro-wave Dielectric Ceramics,' J. Mat. Res., 12 [12] 3293-99 (1997)
DOI
ScienceOn
|
8 |
B. E. Warren, X-ray Diffraction, 2nd Ed., p251, Addison Wesley, Reading MA, 1969
|
9 |
B. D. Cullity, Elements of X-ray Diffraction, 2nd Ed., p285, Addison-wesley, Reading MA, 1978
|
10 |
B. F. Sorensen. S. Sarraute, O. Jergensen and A. Horsewell 'Thermally Induced Delamination of Multilayers,' Acta Mat., 46 [8] 2603-15 (1998)
DOI
ScienceOn
|
11 |
W. Chang, J. S. Horwitz, A. C. Carter, J. M. Pond, S. W. Kirchoefer, C. M. Gilmore and D. B. Chrisey, 'The Effect of Annealing on the Microwave Properties of Ba ,Sr r,TiO Thin Fi\ms,' Appt. Phys. Lett., 74 [7] 1033-35 (1999)
DOI
ScienceOn
|
12 |
Y. Kim, J. Oh, T-G. Kim and B. Park, 'In Quence of the Microstructures on the Dielectric Properties of ZrTiO Thin Films at Microwave-frequency Range,' Jpn. J. Appt. Phys., 40 [7] 4599-03 (2001)
DOI
|
13 |
T. Kim, J. Oh, B. Park and K. S. Hong, 'Correlation between Strain and Dielectric Properties in ZrTiO Thin Films,' Appt. Phys. Lett., 76 [21] 3043-45 (2000)
DOI
ScienceOn
|
14 |
B. W. Hakki and P. D. Coleman, 'A Dielectric Method of Measuring Inductive Capacitance in the Millimeter Range,' IEEE Trans. Microwave Theory Tech., 8 402-10 (1960)
DOI
|