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http://dx.doi.org/10.9723/jksiis.2018.23.1.087

Inspection of Vehicle Headlight Defects  

Kim, Kun Hong (금오공과대학교 컴퓨터IT학과, 프로텍 코퍼레이션)
Moon, Chang Bae (금오공과대학교 ICT융합특성화연구센터)
Kim, Byeong Man (금오공과대학교 컴퓨터소프트웨어공학과)
Oh, Duk Hwan (금오공과대학교 컴퓨터소프트웨어공학과)
Publication Information
Journal of Korea Society of Industrial Information Systems / v.23, no.1, 2018 , pp. 87-96 More about this Journal
Abstract
In this paper, we propose a method to determine whether there is a defect by using the similarity between ROIs (Region of Interest) of the standard image and ROIs of the image which is corrected in position and rotation after capturing the vehicle headlight. The degree of similarity is determined by the template matching based on the histogram of image, which is a some modification of the method provided by OpenCV where template matching is performed on the raw image not the histogram. The proposed method is compared with the basic method of OpenCV for performance analysis. As a result of the analysis, it was found that the proposed method showed better performance than the OpenCV method, showing the accuracy close to 100%.
Keywords
Image Processing; Parallel Processing; Vehicle Headlight; Similarity;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
연도 인용수 순위
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