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http://dx.doi.org/10.9723/jksiis.2015.20.3.051

Efficiency Validation for the OVM-based Variability Tracing Method  

Lee, Jihyun (대전대학교 혜화리버럴아트칼리지)
Hwang, Sunmyung (대전대학교 컴퓨터공학과)
Publication Information
Journal of Korea Society of Industrial Information Systems / v.20, no.3, 2015 , pp. 51-60 More about this Journal
Abstract
Traceability targets provision of information to stakeholders required for analyzing impacts among artifacts due to changes. Unlike single product development, in software product line developing the family of products the complexity of maintaining and managing traceability between two life cycles, domain and application engineering is so high. Accordingly, variability traceability management approach centred on orthogonal variability model that manages variability separated from development artifacts has been conceptually proposed, but its efficiency has not verified yet. This paper verifies whether orthogonal variability model based traceability can provide required traceability through an example. As the results, the OVM-based variability tracing method supports well to narrow down artifacts affected by the changes. However, the method does not support tracing the exact artifacts or exact part of an artifact affected by the change.
Keywords
Software product line; Traceability; Variability; Orthogonal variability model;
Citations & Related Records
Times Cited By KSCI : 3  (Citation Analysis)
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