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http://dx.doi.org/10.9723/jksiis.2014.19.6.043

A TFT-LCD Defect Detection Method based on Defect Possibility using the Size of Blob and Gray Difference  

Gu, Eunhye (경북대학교 전자공학부)
Park, Kil-Houm (경북대학교 전자공학부)
Publication Information
Journal of Korea Society of Industrial Information Systems / v.19, no.6, 2014 , pp. 43-51 More about this Journal
Abstract
TFT-LCD image includes a defect of various properties. TFT-LCD image have a recognizable defects in the human inspector. On the other hand, it is difficult to detect defects that difference between the background and defect is very low. In this paper, we proposed sequentially detect algorithm from pixels included in the defect region to limited defects. And blob analysis methods using the blob size and gray difference are applied to the defect candidate image. Finally, we detect an accurate defect blob to distinguish the noise. The experimental results show that the proposed method finds the various defects reliably.
Keywords
Defect detection; Iterative detection; TFT-LCD; Blob analysis;
Citations & Related Records
Times Cited By KSCI : 5  (Citation Analysis)
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