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J. Keane , D. Persaud and C. H. Kim "An all-in-one silicon odometer for separately monitoring HCI, BTI, and TDDB", Proc. IEEE VLSI Circuits Conf., pp.108 -109 2009.
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Yeon-Bo Kim, Kyung Ki Kim, "The Impact of TDDB Failure on Nanoscale CMOS Digital Circuits", Journal of the Korea Industrial Information System Society, V. 17, No. 3, pp.27-34, July 2012.
과학기술학회마을
DOI
ScienceOn
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Kyung Ki Kim, "Analysis of Electromigration in Nanoscale CMOS Circuits," Journal of the Korea Industrial Information System Society, V. 18, No. 1, pp.19-24, Feb. 2013.
과학기술학회마을
DOI
ScienceOn
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Kyung Ki Kim, "Minimal Leakage Pattern Generator," Journal of the Korea Industrial Information System Society, V. 16, No. 5, pp.1-8, Dec. 2011.
과학기술학회마을
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Kyung Ki Kim, "On-chip Aging Sensor Circuits for Reliable Nanometer MOSFET Digital Circuits" Circuits and Systems II: Express Briefs, IEEE Transactions on, vol.57, no.1, pp.798-902, Oct.2010.
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Kyung Ki Kim, " Adaptive HCI-aware power gating structure" Quality Electronic Design (ISQED), 2010 11th International Symposium on, pp. 219-224, March.2010.
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Kyung Ki Kim, "Ultra-Voltage Power Gating Structure Using Low Threshold Voltage" Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on, vol.56, no.1, pp.926-930, Dec.2009.
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S. Kim, S. Kosonocky, D. Knebel, "Understanding and minimizing ground bounce during mode transition of power gating structures", IEEE ISLPED, pp. 22-25, Aug. 2003.
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P. Royannez, et. al., "90nm low leakage SoC design techniques for wireless applications", IEEE International Solid-State Circuits Conference, pp. 138-139, Feb. 2005.
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