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Process capability index for single process with multiple measurement locations  

Lee, Do-Kyung (Dept. of Industrial & Systems Eng., Kumoh National Institute of Tech)
Lee, Hyun-Seok (Dept. of Industrial & Systems Eng., Kumoh National Institute of Tech)
Publication Information
Journal of Korean Society of Industrial and Systems Engineering / v.30, no.3, 2007 , pp. 28-36 More about this Journal
Abstract
Process Capability indices (PCIs) have been widely used in manufacturing industries to provide a quantitative measure of process performance. PCIs have been developed to represent process capability more exactly. In the previous studies, only one designated location on each part is measured. But even though in single process, multiple measurement locations on each part are required to calculate the reliable process capability. In this paper, we propose a new process capability index with multiple measurement locations on each part. We showed numerical examples and sensitivity analysis according to the number of measurement locations.
Keywords
Multiple Measurement Locations; System Process Capability;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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