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http://dx.doi.org/10.5762/KAIS.2021.22.2.134

Development of Tilt angle measurement system of plastic thin-film using Position Sensitive Device  

Kim, Gi-Seung (Division of Information Communication, Sunmoon University)
Park, Yoon-Chang (Division of Information Communication, Sunmoon University)
Publication Information
Journal of the Korea Academia-Industrial cooperation Society / v.22, no.2, 2021 , pp. 134-138 More about this Journal
Abstract
Various types of precision plastic thin films are used widely in high-performance displays, such as smartphones. For plastic thin-films manufactured by the Roll-to-Roll process, the film thickness must be measured and managed while moving. In the Roll-to-Roll process, wrinkles are generated when tension is applied to the film, which causes an inclination on the optical axis of the thickness gauge, resulting in a loss of accuracy. Therefore, this study attempted to develop an optical interference tomography measurement system. In this study, the tilt angle of the film was measured to correct the measurement value error in the thickness gauge caused by the tilt of the film. The system was constructed so that the laser was irradiated on the tilted film, and the laser reflected from the film was formed on the PSD. The relationship between the tilt angle of the film and the output value of the PSD was obtained experimentally. Using this, a device to measure the tilt angle of the film was constructed, and angle measurements were taken at a speed of 250,000Hz.
Keywords
Plastic Film; Roll-To-Roll Process; Optical Coherence Tomography; Position Sensitive Device; Tilt Measuring; Regression Analysis;
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