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http://dx.doi.org/10.5762/KAIS.2020.21.12.107

Analysis Study on Patent for Scan-to-BIM Related Technology  

Ryu, Jeong-Won (Division of Architecture, Sunmoon University)
Byun, Na-Hyang (Department of Architecture, Chungbuk National University)
Publication Information
Journal of the Korea Academia-Industrial cooperation Society / v.21, no.12, 2020 , pp. 107-114 More about this Journal
Abstract
Technologies related scan-to-BIM for BIM-based reverse engineering techniques are beginning to be actively introduced in the A.E.C. industry, and the scalability of the technology is growing considerably. This study uses patent analysis based on objective data to find the right direction for Korean Scan-to-BIM technology by identifying the trends in Korea, the United States, Europe, and Japan. This was done using the WIPSON patent search system to find previous research on patent analysis related to building technology, theoretical consideration of scan-to-BIM technology, and published patents. We collected information, verified the process, and extracted valid patents. We used the effective patent data to analyze the annual trend of patent applications, national trends, and technological trends through the International Patent Classification (IPC) code, the types of the top 20 major applicants, and family patent trends.
Keywords
Scan-to-BIM; BIM; Building Information Modeling; Patent Trend; Reverse Engineering; 3d Scan;
Citations & Related Records
Times Cited By KSCI : 7  (Citation Analysis)
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