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http://dx.doi.org/10.5762/KAIS.2011.12.4.1509

Development of a High speed Actuator for electric performance testing System of ceramic chips  

Bae, Jin-Ho (Division of Mechanical and Automotive Engineering, Kongju National University)
Kim, Sung-Gaun (Division of Mechanical & Automotive Engineering, Kongju National University)
Publication Information
Journal of the Korea Academia-Industrial cooperation Society / v.12, no.4, 2011 , pp. 1509-1514 More about this Journal
Abstract
The core of IT products, electronic components, especially the MLCC, chip inductors, chip Varistors and so on. In order to test the electrical characteristics of the chip using the Reno-pin contact test method has been used. In current chips, mass production of semiconductor manufacturing processes, high-speed production test for the chip speed up, precision is required. But Vibration displacement is a very short, so in order to overcome these shortcomings, the displacement amplification to design the structure has been actively studied. In this paper, a building structure with a flexible hinge was designed amplification instrument, semiconductor chip industry in the performance test and inspection equipment to measure the electrical characteristics of high speed linear actuators Reno-Pin using system was developed.
Keywords
PZT Actuator; Chip test; Mechanical amplifier;
Citations & Related Records
Times Cited By KSCI : 4  (Citation Analysis)
연도 인용수 순위
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