1 |
Braglia, M., Frosolini, M., and Zammori, F. (2009), Overall Equipment Effectiveness of a Manufacturing Line (OEEML) : An Integrated Approach to Assess Systems Performance, Journal of Manufacturing Technology Management, 20(1), 8-29.
DOI
ScienceOn
|
2 |
Cho, K. T., Cho, Y. K., and Kang, Y. S. (2003), Decision-making the leader's class analysis enemy who go first, Dong Ah publishing company.
|
3 |
Charnes, A., Cooper, W. W., and Rhodes, E. (1978), Measuring the Efficiency of Decision Making Units, European Journal of Operational Research, 2, 429- 444.
DOI
ScienceOn
|
4 |
Dayhoff, J. E. and Athrrton, R. W. (1984), Simulation of VLSI Manufacturing Areas, VLSI Design, 84-92.
|
5 |
Han, Y. S., Park, D. S., and Lee, C. G. (2005), Standardization of a Simulation 300mm FAB Semiconductor Manufacturing, MASM 2005 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing, 111-118.
|
6 |
Hannan, E. L. (1983), Fuzzy Decison Making with Multiple Objectives and Discrete Membership Functions, International Journal of Man-Machine Studies, 18, 49-54.
DOI
ScienceOn
|
7 |
Jang, H. D. and Lee, J. H. (2011), An Efficient Selection of Promising Technology Using DEA and AHP, Korea Corporation Management Associator, 18(2), 67-85.
|
8 |
Kim, D. S. and Moon, D. H. (2011), A Case Study of Comparing the Measuring Methods for Workloads of Resources in a Manufacturing Process of Semiconductor-Parts, Journal of the Korea Society for Simulation, 20(3), 49-58.
DOI
|
9 |
Kim, J. B., Kim, W. J., and Cho, N. W. (2008), An Efficiency Evaluation among Manufacturing Processes using Hybrid DEA/AHP Model, IE Interfaces, 21(3), 302-311.
|
10 |
Lee, Y. H. (2001), Eastern Exposure of Production Management Study of Semiconductor industry, Journal of the Korean Production and Operations Management Society, 11(3), 85-110.
|
11 |
Moon, D. H., Shin, K. W., Park, C. S., and Kim, D. S. (2009), A Manufacturing System Simulation of Semiconductor Packaging Substrate, Proceedings of 2009 Spring SIM, San Diego, U.S.A., 283-288.
|
12 |
Saaty T. L. (1980), The Analytic Hierarchy Process, McGraw-Hill Inc., New York.
|
13 |
Saaty, T. L. (2001), Decision-Making with the AHP; Why is the Principal Eigenvector Necessary, Proceedings of the Sixth ISAHP, 383-396.
|
14 |
Sinuany-stern, Z., Meherz, Z., and Hadad., Y. (2000), An AHP/DEA Methodology for Ranking Decision Making Units, International Transactions in Operational research, 7, 109-124.
DOI
ScienceOn
|
15 |
Wein, L. M. (1992), On the relationship Between Yield and Cycle time in Semiconductor Wafer Fabrication, IEEE Transactions on Semiconductor Manufacturing, 5(1), 156-158.
DOI
|
16 |
Xu, T., Moon, D. H., Park, C. S., and Zhang, B. L. (2009), A Simulation Study on the Manufacturing Process of Semiconductor Parts Using AHP, Journal of the Korea Society for Simulation, 18(2), 65-75.
|
17 |
Xu, T., Moon, D. H., and Baek, S. G. (2011), A Simulation Study Integrated with Analytic Hierarchy Process (AHP) in an Automotive Manufacturing System, Simulation, in printing (Online available on May 23, 2011).
|
18 |
Yang, T. and Kuo, C. (2001), A Hierarchical AHP/DEA Methodology for the Facilities Layout Design Problem, European Journal of Operational Research, 147(1), 128-136.
|