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http://dx.doi.org/10.7232/JKIIE.2014.40.1.043

Update Cycle Detection Method of Control Limits using Control Chart Performance Evaluation Model  

Kim, Jongwoo (School of Industrial Management Engineering, Korea University)
Park, Cheong-Sool (School of Industrial Management Engineering, Korea University)
Kim, Jun Seok (School of Industrial Management Engineering, Korea University)
Kim, Sung-Shick (School of Industrial Management Engineering, Korea University)
Baek, Jun-Geol (School of Industrial Management Engineering, Korea University)
Publication Information
Journal of Korean Institute of Industrial Engineers / v.40, no.1, 2014 , pp. 43-51 More about this Journal
Abstract
Statistical process control (SPC) is an important technique for monitoring and managing the manufacturing process. In spite of its easiness and effectiveness, some problematic sides of application exist such that the SPC techniques are hardly reflect the changes of the process conditions. Especially, update of control limits at the right time plays an important role in acquiring a reasonable performance of control charts. Therefore, we propose the control chart performance evaluation index (CPEI) based on count data model to monitor and manage the performance of control charts. The CPEI could indicate the degree of control chart performance and be helpful to detect the proper update cycle of control limits in real time. Experiments using real manufacturing data show that the proper update intervals are made by proposed method.
Keywords
Control Chart; Count Data Model; Semiconductor Manufacturing Process; Statistical Process Control; Control Limit;
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Times Cited By KSCI : 3  (Citation Analysis)
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