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Development of Integrated Variable Sampling Interval EngineeringProcess Control & Statistical Process Control System  

Lee, Sung-Jae (CMC Co.)
Seo, Sun-Keun (Department Industrial & Management Systems Engineering, Dong-A University)
Publication Information
Journal of Korean Institute of Industrial Engineers / v.32, no.3, 2006 , pp. 210-218 More about this Journal
Abstract
Traditional statistical process control (SPC) applied to discrete part industry in the form of control charts can look for and eliminate assignable causes by process monitoring. On the other hand, engineering process control (EPC) applied to the process industry in the form of feedback control can maintain the process output on the target by continual adjustment of input variable. This study presents controlling and monitoring rules adopted by variable sampling interval (VSI) to change sampling intervals in a predetermined fashion on the predicted process levels under integrated EPC and SPC systems. Twelve rules classified by EPC schemes(MMSE, constrained PI, bounded or deadband adjustment policy) and type of sampling interval combined with EWMA chart of SPC are proposed under IMA (1,1) disturbance model and zero-order (responsive) dynamic system. Properties of twelve control rules under three patterns of process change (sudden shift, drift and random shift) are evaluated and discussed through simulation and control rules for integrated VSI EPC and SPC systems are recommended.
Keywords
SPC; EPC; Variable Sampling Interval; IMA (1,1) Model; Responsive Dynamic System;
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