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Application of White Light Interferometery Method for the Measurement of Surface Micro-structure of Paper Products and Prints  

Sung Yong Joo (Pulp and Paper Research Center (PPRC), Korea Research Institute of Chemical Technology (KRICT))
Ryu Jeong Yong (Pulp and Paper Research Center (PPRC), Korea Research Institute of Chemical Technology (KRICT))
Song Bong Keun (Pulp and Paper Research Center (PPRC), Korea Research Institute of Chemical Technology (KRICT))
Publication Information
Journal of Korea Technical Association of The Pulp and Paper Industry / v.36, no.4, 2004 , pp. 33-40 More about this Journal
Abstract
A white light interferometery (WLI) method for investigating surface microstructure was introduced. Brief description of the principle of this method was provided. The surface structure of various samples, for example, a liner board paper, a pigment coated paper, a intaglio printed paper and a polymer laminated paper were tested and characterized with the WLI method. The data showed the WLI method provided very detailed information about surface topography, which were little affected by the surface condition such as color, opacity, roughness, etc. The data stitching mode of the WLI method could provide high spatial resolution over a large field-of-view, which made it possible to obtain the statistically valid results. Fast and high repeatability also made this method a promising way for investigating the surface micro-structure of paper products and prints.
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Times Cited By KSCI : 1  (Citation Analysis)
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