The Influence of Ag Thickness on the Electrical and Optical Properties of ZnO/Ag/SnO2 Tri-layer Films |
Park, Yun-Je
(School of Materials Science and Engineering, University of Ulsan)
Choi, Jin-Young (School of Materials Science and Engineering, University of Ulsan) Choe, Su-Hyeon (School of Materials Science and Engineering, University of Ulsan) Kim, Yu-Sung (School of Materials Science and Engineering, University of Ulsan) Cha, Byung-Chul (Advanced Forming Processes R&D Group, Ulsan Regional Division, Korea Institute of Industrial Technology) Kim, Daeil (School of Materials Science and Engineering, University of Ulsan) |
1 | S. K. Kim, S. H. Kim, S. Y. Kim, J. H. Jeon, T. K. Gong, D. Y. Yoon, D. H. Choi, D. I. Son, D. Kim, J. Kor. Inst. Surf. Eng., 47 (2014) 81. DOI |
2 | J. R. Lee, D. Y. Lee, D. G. Kim, G. H. Lee, Y. D. Kim, P. K. Song, Met. Mater. Int., 14 (2008) 745. DOI |
3 | W. T. Yen, Y. C. Lin, P. C. Yao, J. H. Ke, Y. L. Chen, Thin Solid Films, 518 (2010) 3882. DOI |
4 | S. Heo, J. Jeon, T. Gong, H. Moon, S. Kim, B. Cha, J. Kim, U. Jung, S. Park, D. Kim, Ceram. Int., 41 (2015) 9668. DOI |
5 | S. Kim, S. H. Kim, S. Y. Kim, J. Jeon, T. Gong, D. Choi, D. Son, D. Kim, Ceram. Int., 40 (2014) 6673. DOI |
6 | J. Jeon, T. Gong, S. Kim, S. Kim, S. Y. Kim, D. Choi, D. Son, D. Kim, J. Alloys Compd., 639 (2015) 1. DOI |
7 | Y. S. Kim, J. H. Park, D. Kim, Vacuum, 82 (2008) 574. DOI |
8 | M. Bendera, W. Seeliga, C. Daubeb, H. Frankenbergerb, B. Ockerb, J. Stollenwerkb, Thin Solid Films, 326 (1998) 67. DOI |
9 | J. Jeong, H. Kim, M. Yi, Appl. Phys. Lett., 93 (2008) 033301. DOI |
10 | H. Park, J. Kang, S. Na, D. Kim, H. Kim, Sol. Energy Mater. Sol., 93 (2009) 1994. DOI |
11 | M. G. Varnamkhasti, H. R. Fallah, M. Mostajaboddavati, A. Hassanzadeh, Vacuum, 86 (2012) 1318. DOI |
12 | G. Haacke, New figure of merit for transparent conductors, J. Appl. Phys., 47 (1976) 4086. DOI |