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http://dx.doi.org/10.5695/JKISE.2009.42.6.287

The Effect of Passivation Film with Inorganic/Epoxy Layers on Life Time Characteristics of OLED Device  

Lim, Jung-A (Department of Advanced Materials Science and Engineering, Daejin University)
Ju, Sung-Hoo (Department of Advanced Materials Science and Engineering, Daejin University)
Yang, Jae-Woong (Department of Advanced Materials Science and Engineering, Daejin University)
Publication Information
Journal of the Korean institute of surface engineering / v.42, no.6, 2009 , pp. 287-293 More about this Journal
Abstract
The passivation films with epoxy layer on LiF, $SiN_x$ and LiF/$SiN_x$ inorganic layer were fabricated on OLED to protect device from the direct damage of $O_2$ and $H_2O$ and to apply for a buffer layer between OLED device and passivation multi-layer with organic/inorganic hybrid structure as to diminish the thermal stress and expansion. Red OLED doped with 1 vol.% Rubrene in $Alq_3$ was used as a basic device. The device structure was multi-layer of ITO(150 nm) / ELM200_HIL(50 nm) / ELM002_HTL(30 nm) / $Alq_3$: 1 vol.% Rubrene(30 nm) / $Alq_3$(30 nm) / LiF(0.7 nm) / Al(100 nm). LiF/epoxy applied as a protective layer didn't contribute to the improvement of life time. While in case of $SiN_x$/epoxy, damage was done in the passivation process because of difference in heat expansion between films which could occur during the formation of epoxy film. Using LiF/$SiN_x$/epoxy improved lifetime significantly without suffering damage in the process of forming films, therefore, the best structure of passivation film with inorganic/epoxy layers was LiF/$SiN_x$/E1.
Keywords
OLED; Red; Encapsulation; Passivation; LiF; $SiN_x$; Epoxy;
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