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http://dx.doi.org/10.5695/JKISE.2008.41.1.006

The Comparison to Physical Properties of Large Size Indium Zinc Oxide Transparent Conductive Layer  

Joung, Dae-Young (Samsung Electronics, Co., Ltd., LCD Business, R&D Center)
Lee, Young-Joon (Samsung Electronics, Co., Ltd., LCD Business, R&D Center)
Park, Joon-Yong (Samsung Electronics, Co., Ltd., LCD Business, TFT 3 Part(Mobile))
Yi, Jun-Sin (SungKyunKwan University, School of Information & Communication Engineering, Information & Communication Device Lab.)
Publication Information
Journal of the Korean institute of surface engineering / v.41, no.1, 2008 , pp. 6-11 More about this Journal
Abstract
An Indium Zinc Oxide(IZO) transparent conductive layer was deposited on a large size glass substrate by using magnetron dc sputtering method with varying a deposition temperature. As the deposition temperature decreased to a room temperature, the sheet resistance of IZO film increased. But this deposition temperature range is included in an applicable to a device. From a standpoint of the sheet resistance, the differences of the sheet resistance were not great and the uniformity of the layer was uniformed around 10%. Crystallization particles were shown on the surface of the layer as deposition temperature increased, but these particles were not shown on the surface of the layer as deposition temperature decreased to the room temperature. It didn't make a scrap of difference in a transmittance of varying deposition temperature. Therefore, it is concluded that IZO thin film manufactured by the room temperature deposition condition can be used as a large size transparent conductive layer of a liquid crystal display device.
Keywords
Indium Zinc Oxide; Room temperature deposition; Liquid crystal display; Large size;
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