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http://dx.doi.org/10.5391/JKIIS.2008.18.6.737

Performance Comparisons of Wavelet Based T2-Test and Neural Network in Monitoring Process Profiles  

Kim, Seong-Jun (강릉대학교 산업시스템공학과)
Choi, Deok-Ki (강릉대학교 정밀기계공학과)
Publication Information
Journal of the Korean Institute of Intelligent Systems / v.18, no.6, 2008 , pp. 737-745 More about this Journal
Abstract
Recent developments of process and measurement technology bring much interest to the online monitoring of process operations such as milling, grinding, broaching, etc. The objective of online monitoring systems is to detect process changes as early as possible. This is helpful in protecting facilities against unexpected failures and then preventing unnecessary loss. This paper investigates, when the process monitoring data are obtained as a profile, the monitoring performances of a statistical $T^2$-statistic and a feedforward neural network by using a wavelet transform. Numerical experiments using cutting force data presented by Axinte show that the proposed wavelet based $T^2$-test has an acceptable power in detecting profile changes. However, its operating characteristic is very sensitive to autocorrelation. On the contrary, compared with $T^2$-test, the neural network has more stable performance in the presence of autocorrelation. This indicates that an adaptive feature to analyze noises should be incorporated into the wavelet based $T^2$-test.
Keywords
Profile Monitoring; $T^2$-test; Wavelet; Neural Network; Operating Characteristic Curve;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
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