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http://dx.doi.org/10.5391/JKIIS.2004.14.4.390

Design of Process Management System based on Data Mining and Artificial Modelling for the Etching Process  

Bae, Hyeon (School of Electrical and Computer Engineering, Pusan National University)
Kim, Sung-shin (School of Electrical and Computer Engineering, Pusan National University)
Woo, Kwang-Bang (Automation Technology Research Institute, Yonsei University)
Publication Information
Journal of the Korean Institute of Intelligent Systems / v.14, no.4, 2004 , pp. 390-395 More about this Journal
Abstract
A semiconductor manufacturing process is the complicate and dynamic process, and consists of many sub-processes. An etching process is the most important process in the semiconductor fabrication. In this paper, the decision support system based upon data mining and knowledge discovery is an important factor to improve the productivity and yield. The proposed decision support system consists of a neural network model and an inference system based on fuzzy logic Firstly, the product results are predicted by the neural network model constructed by the product patterns that represent the quality of the etching process. And the product patters are classified by expert's knowledge. Finally, the product conditions are estimated by the fuzzy inference system using the rules extracted from the classified patterns. Prediction of product qualities can be linked to each input and process variables. We employ data mining and intelligent techniques to find the best condition of the etching process. The proposed decision support system is efficient and easy to be implemented for the process management based upon expert's knowledge.
Keywords
Neural network; fuzzy logic; decision support system; data mining;
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