A Case Study on the Target Sampling Inspection for Improving Outgoing Quality |
Kim, Junse
(Quality Innovation Team, Global CS Center, SAMSUNG ELECTRONICS)
Lee, Changki (Quality Innovation Team, Global CS Center, SAMSUNG ELECTRONICS) Kim, Kyungnam (Quality Innovation Team, Global CS Center, SAMSUNG ELECTRONICS) Kim, Changwoo (Quality Innovation Team, Global CS Center, SAMSUNG ELECTRONICS) Song, Hyemi (Quality Innovation Team, Global CS Center, SAMSUNG ELECTRONICS) Ahn, Seoungsu (Quality Innovation Team, Global CS Center, SAMSUNG ELECTRONICS) Oh, Jaewon (Quality Innovation Team, Global CS Center, SAMSUNG ELECTRONICS) Jo, Hyunsang (Quality Innovation Team, Global CS Center, SAMSUNG ELECTRONICS) Han, Sangseop (Quality Innovation Team, Global CS Center, SAMSUNG ELECTRONICS) |
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