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http://dx.doi.org/10.7469/JKSQM.2015.43.3.373

Development of a Reliability Index using Design, Development and Production Information  

Kim, Sung Kyu (Department of Industrial and Management Engineering, Kyonggi University Graduate School)
Park, Jung Won (Korea Testing Laboratory)
Kim, Yong Soo (Department of Industrial and Management Engineering, Kyonggi University)
Publication Information
Journal of Korean Society for Quality Management / v.43, no.3, 2015 , pp. 373-382 More about this Journal
Abstract
Purpose: In this paper, we developed a reliability index (RI) to efficiently compare reliability of products based on the design, development and production information such as reliability tests, quality, product life-cycle management. RI also can be applied to reliability prediction of a novel product as well as comparison evaluation among existing products. Methods: For evaluating RI, we proposed evaluation process which is composed of five steps. Target modules are selected based on warranty data and correlation analysis. Scores of selected target modules are calculated by scoring function. Finally, weights of RI model are determined by optimization method. Results: This paper presented an empirical analysis based on failure data of mobile devices. In this case study, we demonstrated that there is a direct correlation between evaluated RI and field failure probability of each product. Conclusion: We proposed the index for comprehensive and effective assessment of product reliability level. From the procedure of this study, we expected to be applied for reliability estimation of novel products and deduction of field failure-related factors.
Keywords
Reliability Index; Non-linear Programming; Sigmoid Function; Mobile Devices;
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Times Cited By KSCI : 2  (Citation Analysis)
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