1 |
Yan W., Qiu H. and Iyer N.(2008), "Feature extraction for bearing prognostics and health management," (phm)-a survey (preprint) (No. AFRL-RX-WP-TP-2008-4309). AIR FORCE RESEARCH LAB WRIGHT-PATTERSON AFB OH MATERIALS AND MANUFACTURING DIRECTORATE.
|
2 |
An D., Kim N. H. and Choi J.(2016), "Bearing Prognostics Method Based on Entropy Decrease at Specific Frequency," In 18th AIAA Non-Deterministic Approaches Conference, p.1678.
|
3 |
Antoni J.(2006), "The spectral kurtosis: a useful tool for characterising non-stationary signals," Mechanical Systems and Signal Processing, vol. 20, no. 2, pp.282-307.
DOI
|
4 |
FEMTO Bearing Data Set, NASA Ames Prognostics Data Repository, http://ti.arc.nasa.gov/project/ prognostic-data-repository, NASA Ames Research Center, Moffett Field, CA.
|
5 |
NECTOUX, Patrick et al.(2012), PRONOSTIA: An experimental platform for bearings accelerated degradation tests, In: IEEE International Conference on Prognostics and Health Management, PHM'12. IEEE Catalog Number: CPF12PHM-CDR, p.1-8.
|
6 |
Note S. F. A.(2012), Rolling Element Bearings, REB, Sales Technology, Inc, League City TX.
|
7 |
Randall R. B. and Antoni J.(2011), "Rolling element bearing diagnostics-a tutorial," Mechanical systems and signal processing, vol. 25, no. 2, pp.485-520.
DOI
|
8 |
Siegel D., Lee J. and Canh L.(2011), "Methodology and framework for predicting rolling element helicopter bearing failure," Prognostics and Health Management (PHM), 2011 IEEE Conference on. IEEE.
|
9 |
Sutrisno E., Oh H., Vasan A. S. S. and Pecht M.(2012), "Estimation of remaining useful life of ball bearings using data driven methodologies," In Prognostics and Health Management (PHM), 2012 IEEE Conference on, IEEE, pp.1-7.
|
10 |
Siew W. S., Smith W. A., Peng Z. and Randall R. B.(2015), "Fault Severity Trending in Rolling Element Bearings," Acoustics 2015 Hunter Valley.
|
11 |
Wang T.(2012), "Bearing life prediction based on vibration signals: A case study and lessons learned". In Prognostics and Health Management (PHM), 2012 IEEE Conference on, IEEE, pp.1-7.
|