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http://dx.doi.org/10.7236/JIIBC.2020.20.4.107

Semi-supervised Model for Fault Prediction using Tree Methods  

Hong, Euyseok (Dept. of Computer Engineering, Sungshin Women's University)
Publication Information
The Journal of the Institute of Internet, Broadcasting and Communication / v.20, no.4, 2020 , pp. 107-113 More about this Journal
Abstract
A number of studies have been conducted on predicting software faults, but most of them have been supervised models using labeled data as training data. Very few studies have been conducted on unsupervised models using only unlabeled data or semi-supervised models using enough unlabeled data and few labeled data. In this paper, we produced new semi-supervised models using tree algorithms in the self-training technique. As a result of the model performance evaluation experiment, the newly created tree models performed better than the existing models, and CollectiveWoods, in particular, outperformed other models. In addition, it showed very stable performance even in the case with very few labeled data.
Keywords
Fault prediction; Semi-supervised learning; CollectiveWoods;
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Times Cited By KSCI : 3  (Citation Analysis)
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1 E. Hong, "Software Fault Prediction using Semi-supervised Learning Methods," Journal of the Institute of Internet, Broadcasting and Communication, Vol.19, No.3, pp.127-133, June 2019. DOI: https://doi.org/10.7236/JIIBC.2019.19.3.127   DOI
2 R. Malhotra, "A systematic review of machine learning techniques for software fault prediction," Applied Soft. Computing Vol.27, pp.504-518, 2015. DOI: https://doi.org/10.1016/j.asoc.2014.11.023   DOI
3 H. Lu, B. Cukic, and M. Culp, "A Semi-Supervised Approach to Software Defect Prediction," Proc. of COMPSAC, Sept. 2014. DOI: https://doi.org/10.1109/COMPSAC.2014.65
4 C. Catal and D. Banu. "Unlabelled extra data do not always mean extra performance for semi- supervised fault prediction," Expert Systems, Vol.26 No.5, pp.458-47, Nov. 2009. DOI:https://doi.org/10.1111/j.1468-0394.2009.00509.x   DOI
5 H. Lu, B. Cukic, and M. Culp, "An iterative semisupervised approach to software fault prediction," Proc. of PROMISE '11, 2011. DOI: https://doi.org/10.1145/2020390.2020405
6 Y. Jiang, M. Li, and Z.H. Zhou, "Software defect detection with ROCUS," Journal of Computer Science and Technology, Vol.26 No.2, pp.328-342. March 2011. DOI: https://doi.org/10.1007/s11390-011-9439-0   DOI
7 M. Li, H. Zhang, R. Wu, and Z. H. Zhou, "Samplebased software defect prediction with active and semi-supervised learning," Automated Software Engineering, Vol.19, No.2, pp.201-230, June 2012. DOI: https://doi.org/10.1007/s10515-011-0092-1   DOI
8 N. Seliya and T.M. Khoshgoftaar, "Software quality estimation with limited fault data: a semi- supervised learning perspective," Software Quality Journal Vol.15 No.3, pp.327-344, Sept. 2007. DOI: https://doi.org/10.1007/s11219-007-9013-8   DOI
9 P. Sen, G. Namata, M. Bilgic, L. Getoor, B. Galligher, and T. Eliassi-Rad, "Collective classification in network data," AI magazine, Vol. 29, No.3, pp.93-106, 2008. DOI: https://doi.org/10.1609/aimag.v29i3.2157
10 E. Frank, M. A. Hall, and I. H. Witten, The WEKA Workbench. Online Appendix for "Data Mining: Practical Machine Learning Tools and Techniques", Morgan Kaufmann, Fourth Edition, 2016.
11 E. Hong, "Ambiguity Analysis of Defectiveness in NASA MDP data sets," Journal of Information Technology Services, Vol.12, No.2, pp.361-371, 2013. DOI: https://doi.org/10.9716/KITS.2013.12.2.361   DOI
12 M. Shepperd, Q. Song, Z. Sun, and C. Mair, "Data Quality : Some Comments on the NASA Software Defect Data Sets," IEEE Trans. Software Engineering, Vol.39, No.9, pp.1208-1215. Sept. 2013. DOI: https://doi.org/10.1109/TSE.2013.11   DOI
13 T. Fawcett, "An introduction to ROC analysis," Pattern recognition letters, Vol.27, No.8, pp.861- 874, June 2006. DOI: https://doi.org/10.1016/j.patrec.2005.10.010   DOI
14 Eun-Mi Kim, "Adaptive Network Model for the Recognition of Software Quality Attributes," Journal of KIIT, Vol.15, No.11, pp.103-109, 2017. DOI: https://10.14801/jkiit.2017.15.11.103