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http://dx.doi.org/10.7236/JIIBC.2019.19.4.21

A Study on TE Scattering by a Resistive Strip Grating Between a Double Dielectric Layer Using PMM  

Yoon, Uei-Joong (Dept. of Biomedical Engineering, Gachon University)
Publication Information
The Journal of the Institute of Internet, Broadcasting and Communication / v.19, no.4, 2019 , pp. 21-26 More about this Journal
Abstract
In this paper, TE(transverse electric) scattering problems by a resistive strip grating between a double dielectric layer are analyzed by using the PMM(point matching method) known as a numerical method of electromagnetic fileld. The boundary conditions are applied to obtain the unknown field coefficients, the scattered electromagnetic fields are expanded in a series of Floquet mode functions, and the resistive boundary condition is applied to analysis of the resistive strip. The numerical results for the normalized reflected and transmitted power are analyzed by according as the width and spacing of resistive strip, the relative permittivity and thickness of the double dielectric layers, incident angles, and uniform resisitivity. Typically, the reflected power for the conductive strip increased as the value of the relative dielectric constant increased, the reflected power for the resistive strip with uniform resistivity decreased as the value of the resisvivity increased. The numerical results for the presented structure of this paper are shown in good agreement compared to those of the existing papers.
Keywords
TE scattering; Conductive boundary condition; double dielectric layer;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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