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Regression Progress to Evaluate Metal Scale Thickness using Microwave  

Muhn, Sung-Jin (포항공과대학교 전자전기공학과)
Park, Wee-Sang (포항공과대학교 전자전기공학과)
Publication Information
The Journal of the Institute of Internet, Broadcasting and Communication / v.10, no.5, 2010 , pp. 1-5 More about this Journal
Abstract
This paper deals with a method to measure the thickness of scale-layer, iron oxide formed on the surface of the rolling steel, using a dielectric lens antenna. The dielectric lens antenna has an independent characteristic with the frequency in the X-band and changes the spherical wave radiated from a horn antenna into a plane wave at the focusing point. Using this concept, we regard a scale-layer on the rolling steel as a dielectric-PEC(Perfect Electric Conductor) layer and apply a theoretical analysis of the normal-incident plane wave. To reduce the phase error arising from the use of the dielectric lens antenna, this paper utilizes a regression process algorithm. In comparison with the conventional iteration algorithm, the present algorithm led to a unique solution for the thickness of the scale-layer.
Keywords
Scale thickness; Dielectric lens antenna; Regression progress;
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