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http://dx.doi.org/10.5764/TCF.2009.21.1.053

A Defect Inspection Algorithm Using Multi-Resolution Analysis based on Wavelet Transform  

Kim, Kyung-Joon (Department of Organic Materials and Fiber Engineering, Soongsil University)
Lee, Chang-Hwan (Department of Organic Materials and Fiber Engineering, Soongsil University)
Kim, Joo-Yong (Department of Organic Materials and Fiber Engineering, Soongsil University)
Publication Information
Textile Coloration and Finishing / v.21, no.1, 2009 , pp. 53-58 More about this Journal
Abstract
A real-time inspection system has been developed by combining CCD based image processing algorithm and a standard lighting equipment. The system was tested for defective fabrics showing nozzle contact scratch marks, which were one of the frequently occurring defects. Multi-resolution analysis(MRA) algorithm were used and evaluated according to both their processing time and detection rate. Standard value for defective inspection was the mean of the non-defect image feature. Similarity was decided via comparing standard value with sample image feature value. Totally, we achieved defective inspection accuracy above 95%.
Keywords
Digital Textile Printing(DTP); inspection system; real-time image processing; multi-resolution analysis;
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