1 |
Daubechies, 'Ten Lectures in Wavelets', SIAM, Philadelphia, Pennsylvania, 1992
|
2 |
Mathworks Inc., Optimization Toolbox User's Manual, 1996
|
3 |
Jasper, W. J., Garnier, S.J. and Potlapalli, H. Texture Characterization and Defect Detection Using Adaptive Wavelets, J. Korean Fiber Soc., 35(11), 3140-3149(1996)
|
4 |
Wulfhost, B. and Friebel, W., Significance of Sliver Evenness for Yarn Quality, Melliand Textilberichte International, P. E37, 1986
|
5 |
Jooyong Kim, Moon W. Suh, Development of a Digital Process Infonnation System using Stochastic Models, J. Korean Fiber Soc., 38(2), 79-86(2001)
|
6 |
Turcajova, R. and Kautsky, J., Shift Products and Factorizations of Wavelet Matrices, Numerical Algorithms, 41, 27-54(1994)
|
7 |
G. Wallace, The JPEG still picture compression standard, IEEE TCE, P.38, 1992
|
8 |
Furter, R., Evenness Testing in Yam Production. Part2, The Textile Institute, Manchester, England, 1982
|
9 |
Jooyong Kim, Moon W. Suh, Characterization and Compression of Yam Density profiles by Multiresolution Analysis, J. Korean Fiber Soc., 38(1), 21-27(2001)
|