1 |
R. Gomaa, I. Adly, K. Sharshar, A. Safwat, H. Ragai, Radiation tolerance assessment of commercial ZigBee wireless modules, IEEE Radiat. Eff. Data Work. 2015-Janua (2014) 1-5, https://doi.org/10.1109/REDW.2014.7004584.
DOI
|
2 |
M.H. Jeong, C.J. Sullivan, S. Wang, Complex radiation sensor network analysis with big data analytics, 2015, IEEE Nucl. Sci. Symp. Med. Imaging Conf. NSS/MIC 2015 (2016), https://doi.org/10.1109/NSSMIC.2015.7581760, 1-4.
DOI
|
3 |
M. Nancekievill, J. Espinosa, S. Watson, B. Lennox, A. Jones, M.J. Joyce, J.I. Katakura, K. Okumura, S. Kamada, M. Katoh, K. Nishimura, Detection of simulated fukushima daichii fuel debris using a remotely operated vehicle at the naraha test facility, Sensors (2019), https://doi.org/10.3390/s19204602.
DOI
|
4 |
K. Vetter, R. Barnowski, J.W. Cates, A. Haefner, T.H.Y. Joshi, R. Pavlovsky, B.J. Quiter, Advances in nuclear radiation sensing: enabling 3-D gamma-ray vision, Sensors (2019) 19, https://doi.org/10.3390/s19112541.
DOI
|
5 |
B.J. Blaney, E.P. Management, Benefit by Installing Reliable, Secure Wireless Communications Networks at Your Plant Mid-year Meeting, 2012.
|
6 |
F. Marturano, J.F. Ciparisse, A. Chierici, F. D'errico, D. Di Giovanni, F. Fumian, R. Rossi, L. Martellucci, P. Gaudio, A. Malizia, Enhancing radiation detection by drones through numerical fluid dynamics simulations, Sensors (2020), https://doi.org/10.3390/s20061770.
DOI
|
7 |
R.T. Johnson, F.V. Thome, C.M. Craft, A survey of aging of electronics with application to nuclear power plant instrumentation, IEEE Trans. Nucl. Sci. (1983), https://doi.org/10.1109/TNS.1983.4333137.
DOI
|
8 |
K. Korsah, R.T. Wood, O. Ridge, O. Ridge, C.E. Antonescu, U.S.N.R. Commission, Application of Microprocessor-Based Equipment in Nuclear Power Plants C Technical Basis for a Qualification Methodology, 2008.
|
9 |
M. Manghisoni, L. Ratti, V. Re, V. Speziali, G. Traversi, A. Candelori, Comparison of ionizing radiation effects in 0.18 and 0.25 ㎛ CMOS technologies for analog applications, IEEE Trans. Nucl. Sci. 50 (2003) 1827-1833, https://doi.org/10.1109/TNS.2003.820767.
DOI
|
10 |
J.R. Schwank, M.R. Shaneyfelt, D.M. Fleetwood, J.A. Felix, P.E. Dodd, P. Paillet, V. Ferlet-Cavrois, Radiation effects in MOS oxides, IEEE Trans. Nucl. Sci. 55 (2008) 1833-1853, https://doi.org/10.1109/TNS.2008.2001040.
DOI
|
11 |
O. Ridge, U.S.N.R. Commission, Assessment of Wireless Technologies and Their Application at Nuclear Facilities Assessment of Wireless Technologies and Their Application at Nuclear Facilities, 2004.
|
12 |
J.J. Wang, S. Samiee, H.S. Chen, C.K. Huang, M. Cheung, J. Borillo, S.N. Sun, B. Cronquist, J. McCollum, Total ionizing dose effects on flash-based field programmable gate array, IEEE Trans. Nucl. Sci. 51 (2004) 3759-3766, https://doi.org/10.1109/TNS.2004.839255.
DOI
|
13 |
S. Kim, J. Lee, I. Kwon, D. Jeon, TID-tolerant inverter designs for radiation-hardened digital systems, Nucl. Instruments Methods Phys. Res. Sect. A Accel. Spectrometers, Detect. Assoc. Equip. (2020), https://doi.org/10.1016/j.nima.2018.10.151.
DOI
|
14 |
B. Mossawir, I.R. Linscott, U.S. Inan, J.L. Roeder, J.V. Osborn, S.C. Witczak, E.E. King, S.D. LaLumondiere, A TID and SEE radiation-hardened, wideband, low-noise amplifier, in: IEEE Trans. Nucl. Sci., 2006, https://doi.org/10.1109/TNS.2006.886219.
DOI
|
15 |
Digi international inc, Available online, https://www.digi.com/products/embedded-systems/digi-xbee/rf-modules/2-4-ghz-modules/xbee-digimesh-2-4. (Accessed 30 March 2020).
|
16 |
D. Custodian, E.S. Agency, TOTAL DOSE STEADY-STATE IRRADIATION TEST METHOD ESCC Basic Specification No . 22900, 2007, pp. 1-17. Test.
|
17 |
L. Schmidt, A. Horta, S. Pereira, A. Delicado, The Fukushima nuclear disaster and its effects on media framing of fission and fusion energy technologies, 4th Int. Conf. Adv. Nucl. Instrum. Meas. Methods Their Appl. ANIMMA 2015 (2015), https://doi.org/10.1109/ANIMMA.2015.7465637, 2015.
DOI
|
18 |
S. Gaillot, B. Pouchin, J.G. Marques, I. Lopez-Calle, F.J. Franco, J.A. Agapito, Jules Horowitz reactor project. Exploration tests concerning WIFI modules behaviour under gamma flux, Proc. Eur. Conf. Radiat. Its Eff. Components Syst. RADECS. (2011) 795-799, https://doi.org/10.1109/RADECS.2011.6131313.
DOI
|
19 |
M.R. Shaneyfelt, J.R. Schwank, S.C. Witczak, D.M. Fleetwood, R.L. Pease, P.S. Winokur, L.C. Riewe, G.L. Hash, Thermal-stress effects of enhanced low dose rate sensitivity in linear bipolar ICs, IEEE Trans. Nucl. Sci. 47 (2000) 2539-2545, https://doi.org/10.1109/23.903805.
DOI
|
20 |
W. Chen, V. Pouget, G.K. Gentry, H.J. Barnaby, B. Vermeire, B. Bakkaloglu, S. Kiaei, K.E. Holbert, P. Fouillat, Radiation hardened by design RF circuits implemented in 0.13 ㎛ CMOS technology, in: IEEE Trans. Nucl. Sci., 2006, https://doi.org/10.1109/TNS.2006.885009.
DOI
|
21 |
C.M. Ramya, M. Shanmugaraj, R. Prabakaran, Study on ZigBee technology, in: ICECT 2011 - 2011 3rd Int. Conf. Electron. Comput. Technol., 2011, https://doi.org/10.1109/ICECTECH.2011.5942102.
DOI
|
22 |
K. Kruckmeyer, J.S. Prater, B. Brown, T. Trinh, Analysis of low dose rate effects on parasitic bipolar structures in CMOS processes for mixed-signal integrated circuits, IEEE Trans. Nucl. Sci. (2011), https://doi.org/10.1109/TNS.2011.2116041.
DOI
|
23 |
D.M. Fleetwood, Total ionizing dose effects in MOS and low-dose-rate-sensitive linear-bipolar devices, IEEE Trans. Nucl. Sci. 60 (2013) 1706-1730, https://doi.org/10.1109/TNS.2013.2259260.
DOI
|