Radiation testing of low cost, commercial off the shelf microcontroller board |
Fried, Tomas
(Engineering Department, Lancaster University)
Di Buono, Antonio (Department of Electrical and Electronic Engineering, The University of Manchester) Cheneler, David (Engineering Department, Lancaster University) Cockbain, Neil (National Nuclear Laboratory) Dodds, Jonathan M. (National Nuclear Laboratory) Green, Peter R. (Department of Electrical and Electronic Engineering, The University of Manchester) Lennox, Barry (Department of Electrical and Electronic Engineering, The University of Manchester) Taylor, C. James (Engineering Department, Lancaster University) Monk, Stephen D. (Engineering Department, Lancaster University) |
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