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A study for safety-accident analysis pattern extract model in semiconductor industry  

Yoon Yong-Gu (아주대학교 산업공학과)
Park Peom (아주대학교 산업정보시스템)
Publication Information
Journal of the Korea Safety Management & Science / v.8, no.2, 2006 , pp. 13-23 More about this Journal
Abstract
The present study has investigated the patterns and the causes of safety -accidents on the accident-data in semiconductor Industries through near miss report the cases in the advanced companies. The ratio of incomplete actions to incomplete state was 4 to 6 as the cases of accidents in semiconductor industries in the respect of Human-ware, Hard- ware, Environment-ware and System-ware. The ratio of Human to machine in the attributes of semiconductor accident was 4 to 1. The study also investigated correlation among the system related to production, accident, losses and time. In semiconductor industry, we found that pattern of safety-accident analysis is organized potential, interaction, complexity, medium. Therefore, this study find out that semiconductor model consists of organization, individual, task, machine, environment and system.
Keywords
Accident; Near-Miss; Reason's Accident Causation; Perrow's Normal Accident Theory Model; ANOVA; Extract Model of Semiconductor Industry;
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