1 |
G. Binnig and H. Rohrer, "Scanning Tunneling Microscopy," Helv. Phys. Acta, Vol. 55, pp. 726-735, 1982.
|
2 |
E. W. Muller and T. T. Tsong, Field Ion Microscopy, Elsever, New York, 1968.
|
3 |
D. I. Kim and H. S. Ahn, "Etching voltage control technique for electrochemical fabrication of scanning probe microscope tips," Rev. Sci. Instrum. Vol. 73, pp. 1337-1339, 2002.
DOI
ScienceOn
|
4 |
C. S. Kim, D. H. Kim, M. J. Park, D. Y. Jang, S. H. Ahn, D. C. Han, "Fabrication and Evaluation of Electron Beam Tip for Field Emission," Proceedings of the KSME Spring conference, pp. 224-228, 2007.
|
5 |
Y. Ge, W. Zhang, Y. L. Chen, C. Jin and B. F. Ju, "A Reproducible Electropolishing Technique to Customize Tungsten SPM Probe: From Mathematical Modeling to Realization," Journal of Materials Processing Technology, Vol. 213, pp. 11-19, 2013.
DOI
ScienceOn
|
6 |
B. F. Ju, Y. L. Chen, M. Fu, Y. Chen and Y. Yang, "Systematic Study of Electropolishing Technique for Improving the Quality and Production Reproducibility of Tungsten STM Probe," Sensors and Actuators A, Vol. 155, pp. 136-144, 2009.
DOI
ScienceOn
|
7 |
H. J. Oh, D. Y. Chang, S. O. Kang, "Fabrication of Ultra-sharp Tungsten Tip using Electrochemical Etching System," proceedings of the KSMTE spring conference, pp. 449-452, 2001.
|
8 |
H. S. Ahn, S. A. Chizhik, A.M. Dubravin, V. P. Kazachenko, and V. V. Popov, "Application of Phase Contrast Imaging Atomic Force Microscopy to Tribofilms on DLC Coatings," Wear, Vol. 249, pp. 617-625, 2002.
|