Browse > Article
http://dx.doi.org/10.15207/JKCS.2017.8.11.043

A Study on Scratch Detection of Semiconductor Package using Mask Image  

Lee, Tae-Hi (Dept. of Computer Engineering, Kongju National University)
Park, Koo-Rack (Dept. of Computer Science & Engineering, Kongju National University)
Kim, Dong-Hyun (Dept. of Computer Engineering, Kongju National University)
Publication Information
Journal of the Korea Convergence Society / v.8, no.11, 2017 , pp. 43-48 More about this Journal
Abstract
Semiconductors are leading the development of industrial technology, leading to miniaturization and weight reduction of electronic products as a leading technology, we are dragging the electronic industry market Especially, the semiconductor manufacturing process is composed of highly accurate and complicated processes, and effective production is required Recently, a vision system combining a computer and a camera is utilized for defect detection In addition, the demand for a system for measuring the shape of a fine pattern processed by a special process is rapidly increasing. In this paper, we propose a vision algorithm using mask image to detect scratch defect of semiconductor pockage. When applied to the manufacturing process of semiconductor packages via the proposed system, it is expected that production management can be facilitated, and efficiency of production will be enhanced by failure judgment of high-speed packages.
Keywords
Convergence; Vision System; Semiconductor Package; Edge Extraction; Sobel Mask;
Citations & Related Records
Times Cited By KSCI : 6  (Citation Analysis)
연도 인용수 순위
1 J. In Chai, Y. B. Park, "A Study on Throughput Increase in Semiconductor Package Process of K Manufacturing Company Using a Simulation Model", Journal of the Korea Society for Simulation, Vol. 19, No. 1, pp. 1-11, 2010.
2 H. Y. Choi, D. J. Choi, D. J. Lee, M. G. Chun, "TCP/COF Semiconductor Package Inspection System Using DIgital Image Processing", Congerence of KIIS, Vol. 19, No. 2, pp. 88-91, 2009.
3 Antti Soini, "Machine vision technology take-up in industrial applications", Image and Signal Processing and Analysis, ISPA 2001. Proceedings of the 2nd International Symposium on, pp. 332-338, pp. 19-21, 2001.
4 J. H. Park, G. S. Lee, S. H. Lee, "A Study on the Convergence Technique enhanced GrabCut Algorithm Using Color Histogram and modified Sharpening filter", Journal of the korea Convergence Society, Vol. 6, No. 6, pp. 1-8, 2015.   DOI
5 S. K. Lee, Y. S. Park, G. S. Lee, J. Y. Lee, S. H. Lee, "An Antomatic Object Extraction Method Using Color Features of Object and Background in Image", Journal of Digital Convergence, Vol. 11, No. 12, pp. 459-465, 2013.   DOI
6 Y. J. Yoo, "Case Analysis of the performance contents using virtual reality technology", Journal of the Korea Convergence Society, Vol. 8, No. 5, pp. 145-153, 2017.   DOI
7 K. S. Kim, J. S. Kim, H. N. Joo, "A Study on the 2-Dimensional Vision Inspection Algorithm for the Defects Detection of BGA Device", Journal of the Korean Institute of Illuminating and Electrical Installation Engineers, Vol. 19, No. 7, pp. 53-59, 2005.   DOI
8 Y. S. Yang, "The Motion Detection using Improved Difference Image Analysis Method", Jeju University, Master's Thesis, 2002.
9 M. K. Oh, D. J. Choi, B. M. Jun, "Moving area detection for moving object tracking", Conference of the Korea Contents Association, Vol. 1, No. 2, pp. 281-284, 2003.
10 C. S. Park, H. S. Kim, "FPGA Implementation for Real Time Sobel Edge Detector Block Using 3-Line Buffers", Journal of IKEEE, Vol. 19, No. 1, pp. 10-17, 2015.   DOI
11 X. Zhai, F. Bensaali, S. Ramalingam, "Real-Time License Plate Localisation on FPGA", Computer Society Conference on Computer Vision Pattern Recognition Workshops, pp. 14-19, 2011.
12 Nema M.K., Rakshit S., Chaudhuri S., "Image Denoising Using Edge Model-based Representation of Laplacian Subbands", International Conference on Advances in Pattern Recognition, pp. 329-332, 2009.
13 Hua Xiang, Bin Yan, Qiong Cai, Guangyi Zou, "An edge detection algorithm based-on Sobel operator for images captured by binocular microscope", International Conferenceon Electrical and Control Engineering, pp. 980-982, 2011.
14 H. H. Lee, D. J. Lee, M. G. Jeon, "Alignment System using Template Matching and Corner Detection", Conference of KIIS, Vol 24, No. 2, pp. 21-22, 2014.
15 J. S. Kang, "Application method of cultural heritage contents exhibition combining augmented reality technology", Journal of the Korea Convergence Society, Vol. 8, No. 5, pp. 137-143, 2017.   DOI