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http://dx.doi.org/10.5855/ENERGY.2014.23.1.001

Survey on microcalorimetry about EDS  

Kim, J.H. (KISTI, ReSEAT Program)
Park, K.S. (KISTI, ReSEAT Program)
Oh, C.S. (KISTI, ReSEAT Program)
Publication Information
Journal of Energy Engineering / v.23, no.1, 2014 , pp. 1-6 More about this Journal
Abstract
We have surveyed on microcalorimetry which we can treat with energy dispersive spectrometer(EDS) as wavelength dispersive spectrometer(WDS), to be developed in order to make higher energy resolution as to detect X-ray peak as high as wavelength dispersive spectrometer(WDS). When we take into consideration about energy resolution, Wavelength dispersive spectrometer is 2~20eV and energy dispersive spectrometer is 140~180eV.
Keywords
microcalorimetry; energy dispersive spectrometer(EDS); wavelength dispersive spectrometer(WDS); X-ray peak; energy resolution;
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1 D. A. Wollman, G. C. Hilton, K. D. Irvin, and J. M. Martinis : Proceedings of Microscopy and Microanalysis 1996, (ed. by G. W. Bailey et al.), p.488, San Francisco Press, San Francisco (1996).
2 D. A. Wollman, G. C. Hilton, K. D. Irvin, L. L. Dulcie, D. E. Newbury, and J. M. Martinis : Microscopy and Microanalysis, 3, Suppl. 2, (ed. by G. W. Bailey et al.), p.1073, Springer, New York (1997).
3 D. A. Wollman, C. Jezewski, G. C. Hilton, Q. F. Xiao, K. D. Irvin, L. L. Dulcie, and J. M. Martinis : Microscopy and Microanalysis, 3, Suppl. 2, (ed. by G. W. Bailey et al.), p.1075, Springer, New York (1997).
4 D. A. Wollman, G. C. Hilton, K. D. Irvin, L. L. Dulcie, D. E. Newbury, N. F. Bergren, and J. M. Martinis : Proceedings of the 14th International Conference of Electron Microscopy, (ed. H. A. C. Benavides and M. J. Yacaman), p.573, Institute of Physics Publishing (1998).
5 D. A. Wollman, D. E. Newbury, and S. W. Nam : Microscopy and microanalysis, the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 6, suppl. 2, p.738, (2000).
6 D. A. Wollman, G. C. Hilton, and K. D. Irwin : Microscopy and microanalysis, the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 3, suppl . 2, p.1073, (2000).
7 D. A. Wollman, C. Jezewski, and G. C. Hilton : Microscopy and microanalysis, the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 3, suppl. 2, p.1075, (2000).
8 D. A. Wollman, D. E. Newbury, and G. C. Hilton : Microscopy and microanalysis, the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 5, suppl. 2, p.304, (1999).
9 S. W. Nam, D. A. Wollman, and G. C. Hilton : Microscopy and microanalysis, the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 6, suppl. 2, p.742, (2000).
10 C. B. Vartuli, F. A. Stevie, and D. A. Wollman : Microscopy and microanalysis, the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 6, suppl. 2, p.128, (2000).
11 S. W. Nam, D. A. Wollman, and D. E. Newbury : Microscopy and microanalysis, the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 7, suppl. 2, p.1050, (2001).
12 M. Terauchi, H. Takahashi, and N. Handa : Journal of electron microscopy, 61, p.1, (2012).   DOI
13 M. Terauchi, M. Koike, and K. Fukushima : Journal of electron microscopy, 59, p.251, (2010).   DOI
14 D. Redfern, and A. Sandborg : Microscopy and microanalysis, the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 11, suppl. 2, p.468CD, (2005).