| 1 |
D. Cherns and A. R. Preston : ICEM XI, Kyoto, Jap. Soc. E.M., (1986) 721
|
| 2 |
M. Tanaka, M. Terauchi and T. Kaneyama : Convergent Beam Electron Diffraction II, JEOL, Tokyo (1988)
|
| 3 |
Y. Ishida, H. Ishizu, K. Kohara, and H. Ichinose : Phil. Mag., A42 (1980) 453
|
| 4 |
O. L. Krivanek, A. J. Gubbens, M. K. Kundmann and G. C. Capenter : Proc. 51th Micor. Soc. Amer., Sanfrancisco Press (1993) 586
|
| 5 |
T. A. Manson and B. L. Adams : JOM, 46 (2001)
|
| 6 |
梅澤, 長井 : 재료와 프로세스, 8 (1995) 149
|
| 7 |
黑澤 : 전자현미경기술과 재료개발, 日本金屬學會, 1 (1998) 99
|
| 8 |
G. Thomas and M. J. Goringe : Transmission Electron Microscopy of Materials, John Wiley & Sons, New York (1999)
|
| 9 |
O. Umezawa, K. Nagai and K. Ishikawa : Materials Science and Engineering, A129 (1990) 217
|
| 10 |
D. Cherns and A. R. Preston : J. Electron Micro. Tech., 13 (1989) 111
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|
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