1 |
D. M. Ko, K. S. Choi, "Accurate PCB Outline Extraction and Corner Detection for High Precision Machine Vision," Journal of the Semiconductor & Display Technology, Vol. 16, No. 3, pp. 53-58, 2017 (in Korean).
|
2 |
B. D. Kang, O. H. Kwon, C. U. Seong, J. D. Jeon, J. S. Eom, J. H. Kim, J. W. Lee, S. K. Kim, "Effective Face Detection Using Principle Component Analysis and Support Vector Machine," Journal of Korea Multimedia Society, Vol. 9, No. 11, pp. 1435-1444, 2006.
|
3 |
G. H. Kang, J. M. Shon, G. W. Sim, "Comparative Analysis of Anomaly Detection Models using AE and Suggestion of Criteria for Determining Outliers," Journal of the Korea Society of Computer and Information, Vol. 26, No. 8, pp. 23-30, 2021 (in Korean).
DOI
|
4 |
S. B. Hong, S. W. Hong, K. H. Lee, "Recognition Direction Improvement of Target Object for Machine Vision based Automatic Inspection," Journal of Korea Institute of Information and Communication Engineering, Vol. 23, No. 11, pp. 1384-1390, 2019 (in Korean).
DOI
|
5 |
H. Y. Kim, J. S. Cho, "Exterior Vision Inspection Method of Injection Molding Automotive Parts," Journal of Institute of Korean Electrical Electronics Engineers, Vol. 23, No. 2, pp. 127-132, 2019 (in Korean).
|
6 |
M. J. Kim, J. H. Shin, "Development of Defect Inspection System for Polygonal Containers," Korean Journal of Computational Design and Engineering, Vol. 25, No. 3, pp. 246-255, 2020 (in Korean).
DOI
|
7 |
S. Ren, K. He, R. Girshick, J. Sun, "Faster R-Cnn: Towards Real-Time Object Detection with Region Proposal Networks," IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 39, No. 6, pp. 1137-1149, 2016.
DOI
|
8 |
G. S. Kim, S. Lee, J. S. Cho, "A Learning-Based Visual Inspection System for Part Verification in a Panorama Sunroof Assembly Line Using the SVM Algorithm," Journal of Institute of Control, Robotics and Systems, Vol. 19, No. 12, pp. 1099-1104, 2013 (in Korean).
DOI
|
9 |
G. A. Ryu, K. H. Yoo, "Application of Manufacturing Process Data Classification Using Image Data based CNN," Journal of Information Technology and Architecture, Vol. 15, No. 3, pp. 337-343, 2018 (in Korean).
DOI
|
10 |
R. Girshick, "Fast r-cnn," Proceedings of the IEEE International Conference on Computer Vision, pp.1440-1448, 2015.
|
11 |
J. Redmon, A. Farhadi, "Yolov3: An Incremental Improvement," Computer Vision and Pattern Recognition, pp. 1804-2767, 2018.
|
12 |
A. Bochkovskiy, C. Y. Wang, H. Y. M. Liao, "Yolov4: Optimal Speed and Accuracy of Object Detection," arXiv preprint arXiv:2004.10934, 2020.
|
13 |
Y. Li, Z. Han, H. Xu, L. Liu, X. Li, K. Zhang, "YOLOv3-lite: A Lightweight Crack Detection Network for Aircraft Structure Based on Depthwise Separable Convolutions," Applied Sciences, Vol. 9, No. 18, 2019.
|
14 |
H. J. Park, Y. W. Lee, B. G. Kim, "Efficient Tire Wear and Defect Detection Algorithm Based on Deep Learning," Journal of Korea Multimedia Society, Vol. 24, No. 8, pp. 1026-1034, 2021 (in Korean).
DOI
|
15 |
https://github.com/AlexeyAB/darknet/
|
16 |
J. Redmon, S. Divvala, R. Girshick, A. Farhadi, "You Only Look Once: Unified, Real-Time Object Detection," Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition, pp. 779-788, 2016.
|
17 |
B. G. Han, J. G. Lee, K. T. Lim, D. H. Choi, "Design of a Scalable and Fast YOLO for Edge-Computing Devices," Sensors, Vol. 20, No. 23, 2020.
|
18 |
Y. S. Jung, K. H. Park, "O-ring Size Measurement Based on a Small Machine Vision Inspection Equipment," Journal of the Korea Industrial Information Systems Research, Vol. 19, No. 4, pp. 41-52, 2014 (in Korean).
DOI
|
19 |
H. Y. Maeng, J. H. Kim, Y. H. Ko, "Image Allignment Method Based on CUDA SURF for Multi-Spectral Machine Vision Application," Journal of Korea Multimedia Society, Vol. 17, No. 9, pp. 1041-1051, 2014 (in Korean).
DOI
|
20 |
S. M. Yoon, S. H. Lee, "Development of Defect Inspection System for Polygonal Containers," Journal of Institute of Korean Electrical Electronics Engineers, Vol. 25, No. 3, pp. 485-492, 2021 (in Korean).
|
21 |
P. Adarsh, P. Rathi, M. Kumar, "YOLO v3-Tiny: Object Detection and Recognition using One Stage Improved Model," 2020 6th International Conference on Advanced Computing and Communication Systems, pp. 687-694, 2020.
|
22 |
B. J. Park, K. S. Hahn, H. J. Lee, "Automated Visual Inspection System of Junction Box Using Color Inspection and Template Matching," Journal of Korea Multimedia Society, Vol. 13, No. 3, pp. 392-399, 2010 (in Korean).
|
23 |
D. H. Kim, S. B. Boo, H.C . Hong, W. G. Yeo, N. Y. Lee, "Machine Vision-Based Defect Detection Using Deep Learning Algorithm," Journal of the Korean Society For Nondestructive Testing, Vol. 40, No. 1, pp. 47-52, 2020 (in Korean).
DOI
|
24 |
K. He, G. Gkioxari, P.Dollar, R. Girshick, "Mask R-Cnn," Proceedings of the IEEE International Conference on Computer Vision, pp. 2961-2969, 2017.
|
25 |
C. Y. Wang, A. Bochkovskiy, H. Y. M. Liao, "Scaled-Yolov4: Scaling Cross Stage Partial Network," Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, pp. 13029-13038, 2021.
|