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http://dx.doi.org/10.9717/kmms.2020.23.5.633

Sequential Defect Region Segmentation according to Defect Possibility in TFT-LCD Image  

Chang, Chung Hwan (School of Electronics Engineering, Kyungpook National University)
Lee, SeungMin (Advanced Dental Device Development Institute, Kyungpook National University)
Park, Kil-Houm (School of Electronics Engineering, Kyungpook National University)
Publication Information
Journal of Korea Multimedia Society / v.23, no.5, 2020 , pp. 633-640 More about this Journal
Abstract
Defect region segmentation of TFT-LCD images is performed by combining defect pixels detected by a defect detection method into defect region, or by using morphological operations to segment defect region. Therefore, the result of segmentation of the defect region is highly dependent on the defect detection result. In this paper, we propose a method which segments defect regions sequentially according to the possibility of being included in defect regions in TFT-LCD images. The proposed method repeats the process of detecting a seed using the median value and the median absolute deviation of the image, and segments the defect region using the seeded region growing method. We confirmed the superiority of the proposed method to segment defect regions using pseudo-images and real TFT-LCD images.
Keywords
TFT-LCD Image; Defect Possibility; Defect Detection; Defect Region Segmentation;
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Times Cited By KSCI : 2  (Citation Analysis)
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